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AD-Layer for Spatial Control of Light Induced Degradation on Pin Devices

Published online by Cambridge University Press:  16 February 2011

M. Vieira ,
A. Fantoni ,
E. Fortunato ,
G. Lavareda  and
R. Martins
M. Vieira
Affiliation:
FCT-UNL/UNINOVA, Quinta da Torre, 2825 Monte de Caparica, PORTUGAL
A. Fantoni
Affiliation:
FCT-UNL/UNINOVA, Quinta da Torre, 2825 Monte de Caparica, PORTUGAL
E. Fortunato
Affiliation:
FCT-UNL/UNINOVA, Quinta da Torre, 2825 Monte de Caparica, PORTUGAL
G. Lavareda
Affiliation:
FCT-UNL/UNINOVA, Quinta da Torre, 2825 Monte de Caparica, PORTUGAL
R. Martins
Affiliation:
FCT-UNL/UNINOVA, Quinta da Torre, 2825 Monte de Caparica, PORTUGAL
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Abstract

In this work we report experimental results on light induced metastability of a-Si:H p.i.n. devices with different Microscopic/Macroscopic structures and we discuss them in terms of improved stability through spatial control of charged defects grown during light exposure. By placing a thin (few Å) intrinsic layer (i') between both p/i and i/n a-Si:H interfaces we are able to reduce the effective degradation rate through spatial modification of the electric field profile in the device. The electronic transport and the stability changes that accompany the change in Microstructure (R) and hydrogen content (CH) of the i- and i'-layer, were monitored throughout the entire light induced degradation process and compared with the corresponding μτ product (for both carriers) inferred through steady state photoconductivity and Flying Spot Technique (FST) Measurements. Results show that the degradation rate is a function of CH and R of both layers and can be correlated with the density of microvoids and di-hydride bonding. Since the i'- layers have a higher Cfj bonded mainly as SiH1 radicals (R≈0.4), they act as an hindrance to the growth of the defect, in the active region, generating “gettering centers” whose localisation and density are tailored in such a way that they will control spatially the electric field profile during light exposure.

Preliminary results show improvements in film's stability when the interfacial layer is included. So future progress toward more stable and efficient a-Si:H solar cells will depend on a careful engineering design of the devices.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 336: Symposium A – Amorphous Silicon Technology - 1994 , 1994 , 741
Copyright
Copyright © Materials Research Society 1994

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References

REFERENCES

1 Steabler, D.L. and Wronski, C.R., Appl. Phys. Letters 31, p. 292 (1977).CrossRefGoogle Scholar
2 Carlson, D. E., Appl. Phys. A 41, p. 305 (1986).CrossRefGoogle Scholar
3 Gleason, K. K., Petrich, M. A. and Reimer, J. A., Phys. Rev. B 36, p. 3259 (1987).CrossRefGoogle Scholar
4 Martins, R., Guimarães, L., Fortunato, E., Santos, M. and Ferreira, I., Proc. 8 th EPVSEC, p. 653 (1988).Google Scholar
5 Martins, R., Vieira, M., Soares, F. and Guimarães, L.: 5th PVSEC Conference, p. 975, Kyoto, (1990).Google Scholar
6 Brodsky, H.H., Cardona, M. and Cuomo, J. J., Phys. Rev., B16, p. 3556 (1977).Google Scholar
7 Vieira, M., Fortunato, E., Lavareda, G., Carvalho, C. N. and Martins, R.. MRS, 297, P. 637 S. Francisco (1993).Google Scholar
8 Shah, A.V., Hubin, J., Technical Digest, 5th PVSEC Conference, p. 821, Kyoto (1990).Google Scholar
9 Kakalios, J., Street, R. A. and Jackson, W. B., Phys. Rev. Lett., 59, p. 1037 (1987)Google Scholar
10 Schopp, R.E.I., Daey Ouwens, J., Von der Linden, M. B., van der Werf, C. H. M., van der Weg, W. F. and Alkemafe, P. F. A., MRS, 297, p. 797, S. Francisco (1993).Google Scholar
11 Fantoni, A., Vieira, M., Martins, R., presented at this conferenceGoogle Scholar
12 Santos, P. V., Johnson, N. M. and Street, R. A., MRS, 297, p. 353, S. Francisco (1993).Google Scholar
13 Fischer, D., Pellaton, N., Keppner, H., Shah, A., Fortmant, C. M., Proc. of MRS, 258, p. 887 (1992).Google Scholar