Hostname: page-component-cd9895bd7-gxg78 Total loading time: 0 Render date: 2024-12-29T07:57:35.523Z Has data issue: false hasContentIssue false
  • English
  • Français

Alkali Metal Chalcogenides for Radiation Detection

Published online by Cambridge University Press:  12 October 2011

J. A. Peters ,
Zhifu Liu ,
B. W. Wessels ,
I. Androulakis ,
C. P. Sebastian ,
Hao Li  and
M. G. Kanatzidis
J. A. Peters
Affiliation:
Materials Research Center, Northwestern University, Evanston, IL 60208
Zhifu Liu
Affiliation:
Materials Research Center, Northwestern University, Evanston, IL 60208
B. W. Wessels*
Affiliation:
Materials Research Center, Northwestern University, Evanston, IL 60208 Department of Electrical Engineering and Computer Science, Northwestern University, Evanston, IL 60208
I. Androulakis
Affiliation:
Department of Chemistry, Northwestern University, Evanston, IL 60208
C. P. Sebastian
Affiliation:
Department of Chemistry, Northwestern University, Evanston, IL 60208
Hao Li
Affiliation:
Department of Chemistry, Northwestern University, Evanston, IL 60208
M. G. Kanatzidis
Affiliation:
Department of Chemistry, Northwestern University, Evanston, IL 60208
*
*Email: b-wessels@northwestern.edu
Get access

Abstract

We report on the optical and charge transport properties of novel alkali metal chalcogenides, Cs2Hg6S7 and Cs2Cd3Te4, pertaining to their use in radiation detection. Optical absorption, photoconductivity, and gamma ray response measurements for undoped crystals were measured. The band gap energies of the Cs2Hg6S7 and Cs2Cd3Te4 compounds are 1.63 eV and 2.45 eV, respectively. The mobility-lifetime products for charge carriers are of the order of ~10-3 cm2/V for electrons and ~10-4 cm2/V for holes. Detectors fabricated from the ternary compound Cs2Hg6S7 shows well-resolved spectroscopic features at room temperature in response to ϒ -rays at 122 keV from a 57Co source, indicating its potential as a radiation detector.

Keywords

nuclear materialsoptical propertiesphotoconductivity
Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 1341: Symposium U – Nuclear Radiation Detection Materials , 2011 , mrss11-1341-u05-03
Copyright
Copyright © Materials Research Society 2011

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1. Owens, A., and Peacock, A., “Compound semiconductor radiation detectors”, Nucl. Instr.. & Meth.. in Phys. Res., Vol. 531, pp 18–37 (2004)Google Scholar
2. Schlesinger, T. E., Toney, J. E., Yoon, H., Lee, E. Y., Brunett, B. A., Franks, L., and James, R. B., “Cadmium zinc telluride and its use as a nuclear radiation detector material,” Mater. Sci. Eng., Vol. 32, p. 103, 2001.Google Scholar
3. Luke, P. N., and Amman, M., 15th International Workshop on Room-Temperature Semiconductor X- and Gamma-Ray Detectors, San Diego, Ca, 2006.Google Scholar
4. Axtell, E. A., Liao, J. H., Pikramenou, Z., and Kanatzidis, M. G., Chem. Eur. J. 2 656 (1996)Google Scholar
5. Axtell, E. A., Park, Y., Chondroudis, K., and Kanatzidis, M. G., J. Am. Chem. Soc. 120 124 (1998)Google Scholar
6. Narducci, A.A. and Ibers, J.A., J. Alloys Compds. 306 170 (2000).Google Scholar
7. Androulakis, J., Li, Hao, Malliakas, Christos, Peters, John A., Liu, Zhifu, Wessels, Bruce, Song, Jung-Hwan, Jin, Hosub, Freeman, Arthur J., and Kanatzidis, M. G., Proceedings submitted to MRS (2011)Google Scholar
8. Pankove, J. I., Optical Processes in Semiconductors, Dover, New York (1971).Google Scholar
9. Many, A., J. Phys. Chem. Solids 26, 575 (1965).Google Scholar
10. Burshtein, Z., Akujieze, Justin K., and Silberman, E., J. Appl. Phys. 60, 3182 (1986)Google Scholar
11. Cui, Y., Groza, M., Burger, A., and James, R. B., IEEE Trans. Nucl. Sci. 51 1172 (2004).Google Scholar
12. Cui, Y., Wright, G. W., Ma, X., Chattopadhyay, K., James, R. B., and Burger, A., J. Electron. Mater. 35 1267 (2003).Google Scholar
13. Milbrath, B. D., Peurrung, A. J., Bliss, M., and Weber, W. J., J. Mater. Res., 23, (2008).Google Scholar
14. Burger, A. et al. , J. Electron Mat. 32, 756 (2003).Google Scholar
15. Del Sordo, S. et al. , Sensors, 9 3491 (2009).Google Scholar