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Amorphous-to-crystalline transition in Tb33Fe66 films studied via EXAFS

Published online by Cambridge University Press:  15 February 2011

V. G. Hams ,
B. N. Das ,
W. T. Elam  and
N. C. Koon
V. G. Hams
Affiliation:
US Naval Research Laboratory, Washington, D.C. 20375
B. N. Das
Affiliation:
US Naval Research Laboratory, Washington, D.C. 20375
W. T. Elam
Affiliation:
US Naval Research Laboratory, Washington, D.C. 20375
N. C. Koon
Affiliation:
US Naval Research Laboratory, Washington, D.C. 20375
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Abstract

The amorphous-to-crystalline transition in sputter-deposited amorphous Tb33Fe66 films has been studied using aconversion-electron extended X-ray absorption (EXAFS) technique. Modeling ofthe EXAFS data using theoretical and empirical standards allowed thequantitative measurement of coordination, radial distance, and disorder oflocal atom shells around the Fe sites after varying degrees of heattreatments.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 321: Symposium E – Crystallization and Related Phenomena in Amorphous Materials—Ceramics, Metals, Polymers, and Semiconductors , 1993 , 185
Copyright
Copyright © Materials Research Society 1994

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References

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