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Analysis and Control of the Performance-Limiting Defects in HEM-Grown Silicon for Solar Cells
Published online by Cambridge University Press: 26 February 2011
Abstract
Multicrystalline silicon ingots of 55 cm × 55 cm cross section, 100 kg have been grown by the Heat Exchanger Method (HEM). Controlled growth features have been used to produce large grain size, vertically oriented grain boundaries, large areas of twins with low defect density and rejection of impurities to the top of the ingot. Ambient control has reduced C, N, and O concentration and minimized precipitates with no detectable metallic impurities. High performance solar cells have ben fabricated, and further improvements can be achieved by minimizing dislocation tangles and impurities in localized regions.
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- Copyright © Materials Research Society 1995