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Analysis of Grain Boundaries, Twin Boundaries and Te Precipitates in Cd1−xZnxTe Grown by High-Pressure Bridgman Method

Published online by Cambridge University Press:  10 February 2011

J. R. Heffelfinger ,
D. L. Medlin  and
R. B. James
J. R. Heffelfinger
Affiliation:
Sandia National Laboratories, Materials and Engineering Sciences CenterP. 0. Box 969, Livermore, CA 94551
D. L. Medlin
Affiliation:
Sandia National Laboratories, Materials and Engineering Sciences CenterP. 0. Box 969, Livermore, CA 94551
R. B. James
Affiliation:
Sandia National Laboratories, Materials and Engineering Sciences CenterP. 0. Box 969, Livermore, CA 94551
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Abstract

Gtain boundaries and twin boundaries in commercial Cd1−xZnxTe, which is prepared by a high-pressure Bridgeman technique, have been investigated with transmission electron microscopy, scanning electron microscopy, infrared-light microscopy and visible-light microscopy. Boundaries inside these materials were found to be decorated with Te precipitates. The shape and local density of the precipitates were found to depend on the particular boundary. For precipitates that decorate grain boundaries, their microstructure was found to consist of a single, saucer-shaped grain of hexagonal Te (space group P3,2 1). Analysis of a Te precipate by selected-area diffraction revealed the Te to be aligned with the surrounding Cd1−xZnxTe grains. This alignment was found to match the (111) Cd1−xZxTe planes with the (0 111) planes of hexagonal Te. Crystallographic alignments between the Cd1−xZnxTe grains were also observed for a high-angle grain boundary. The structures of the grain boundaries and the Te/Cd1−xZnxTe interface are discussed.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 484: Symposium F – Infrared Applications of Semiconductors II , 1997 , 247
Copyright
Copyright © Materials Research Society 1998

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