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Applications of ZnS:Mn2+ nanocrystals

Published online by Cambridge University Press:  21 March 2011

J. F. Suyver*
Affiliation:
Debye Institute, Physics and Chemistry of Condensed Matter, Utrecht University, P.O. Box 80.000, 3508 TA Utrecht, The Netherlands.
A. Meijerink
Affiliation:
Debye Institute, Physics and Chemistry of Condensed Matter, Utrecht University, P.O. Box 80.000, 3508 TA Utrecht, The Netherlands.
J. J. Kelly
Affiliation:
Debye Institute, Physics and Chemistry of Condensed Matter, Utrecht University, P.O. Box 80.000, 3508 TA Utrecht, The Netherlands.
*
1 Corresponding author. Tel.: +31-30-2532214; Fax: +31-30-2532403; E-mail: j.f.suyver@phys.uu.nl
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Abstract

Nonstoichiometric precursor-ratios for the synthesis of ZnS:Mn2+ are discussed and the significant influence on the luminescence features and crystal size is explained. From the temperature quenching of the ZnS photoluminescence a luminescence excitation model is proposed. Measurements of the photoelectrochemical properties of nanocrystalline ZnS electrodes doped with Mn2+ are also presented and discussed. The observation of both anodic and cathodic photocurrent is direct evidence for the nanocrystalline nature of the system. In-situ photoluminescence measurements showed stable Mn2+ related photoluminescence over a large potential range.

Type
Research Article
Copyright
Copyright © Materials Research Society 2001

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References

REFERENCES

[1] Hodes, G., Howell, I. D. J. and Peter, L. M., J. Electrochem. Soc. 139, 3136 (1992).Google Scholar
[2] Greenham, N. C., Peng, X. and Alivisatos, A. P., Phys. Rev. B 54, 17628 (1996).Google Scholar
[3] Leeb, J., Gebhardt, V., et al., J. Phys. Chem. B 103, 7839 (1999).Google Scholar
[4] Sooklal, K., Cullum, B. S., Angel, S. M. and Murphy, C. J., J. Phys. Chem. 100, 4551 (1996).Google Scholar
[5] van Dijken, A., Janssen, A. H., Smitsman, M. H. P., Vanmaekelbergh, D. and Meijerink, A., Chem. Mater. 10, 3513 (1998).Google Scholar
[6] Huang, J., Yang, Y., Xue, S., Yang, B., Liu, S. and Shen, J., Appl. Phys. Lett. 70, 2335 (1997).Google Scholar
[7] Yu, I., Isobe, T. and Senna, M., J. Phys. Chem. Solids 57, 373 (1996).Google Scholar
[8] Suyver, J. F., Wuister, S. F., Kelly, J. J. and Meijerink, A., To be submitted for publication, (2001).Google Scholar
[9] Cullity, B. D., Elements of X-ray diffraction (Addison-Wesley, Massachusetts), page 102 (1978).Google Scholar
[10] Ouyang, J., Fang, F. F. and Bard, A. J., J. Electrochem. Soc. 136, 1033 (1989).Google Scholar
[11] Becker, W. G. and Bard, A. J., J. Phys. Chem. 87, 4888 (1983).Google Scholar
[12] Suyver, J. F., Bakker, R., Meijerink, A. and Kelly, J. J., Phys. Stat. Sol. B 224, 307 (2001).Google Scholar