Hostname: page-component-78c5997874-v9fdk Total loading time: 0 Render date: 2024-11-14T08:59:14.740Z Has data issue: false hasContentIssue false

Automated Electron Nanocrystallography

Published online by Cambridge University Press:  01 February 2011

John Spence
Affiliation:
spence@asu.edu, ASU, Physics, Arizona State University, Tempe, Az, Tempe, AZ, 85287, United States
Joseph McKeown
Affiliation:
joseph.mckeown@asu.edu, Arizona State University, Physics, Tempe, AZ, 85287, United States
Haifeng He
Affiliation:
Haifeng.He@fei.com, Lawrence Berkeley Laboratory, NCEM, Cyclotron Rd, Berkeley, CA, 94720, United States
Jinsong Wu
Affiliation:
jinsong-wu@northwestern.edu, Northwestern University, Materials Science, Evanston, IL, 60208, United States
Get access

Abstract

We review methods to solve nanocrystals and obtain a 3D charge-density map at the electron microscope. Experimental tests are demonstrated for kinematic CBED and precession techniques.

Type
Research Article
Copyright
Copyright © Materials Research Society 2008

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

[1] Woodhouse, M., Herman, G., and Parkinson, B., Chem. Mater. 17, 4318 (2005).10.1021/cm050546qGoogle Scholar
[2] Vainshtein, B.K., Structure Analysis by Electron Diffraction (Pergamon, New York, 1964).Google Scholar
[3] Zvyagin, B., Electron Diffraction Analysis of Clay Minerals (Plenum, New York, 1967).10.1007/978-1-4615-8612-8Google Scholar
[4] Dorset, D., Structural Electron Crystallography (Plenum, New York, 1995).10.1007/978-1-4757-6621-9Google Scholar
[5] Weirich, T., Labar, J., and Zou, X., Electron Crystallography, vol. 211, NATO Science Series II (Springer. Berlin, 2006). See also Ultramicroscopy 107 (6), (2007), devoted to inorganic electron crystallography, and the precession method in particular. See also S. Che, Z. Liu, T.Ohsuna, K. Sakmoto, O Terasaki, and T. Tatsumi, Nature 429, 281 (2004) and C. Baerlocher, F. Gramm, L. Massüger, L.B. McCusker, Z. He, S. Hovmöller, and X. Zou, Science 315, 1113 (2007), on zeolites.10.1007/1-4020-3920-4_16Google Scholar
[6] Wu, J., Spence, J., O'Keeffe, M., and Leinenweber, K., Nature Mater. 5, 647 (2006).10.1038/nmat1687Google Scholar
[7] Spence, J. and Zuo, J., Electron Microdiffraction (Plenum, New York, 1992).Google Scholar
[8] Zuo, J. and Spence, J., Phil. Mag. 68, 1055 (1993).10.1080/01418619308219387Google Scholar
[9] Cowley, J. and Spence, J., Ultramicroscopy 6, 359 (1981).10.1016/S0304-3991(81)80237-9Google Scholar
[10] He, H. and Nelson, C., Ultramicroscopy 107, 340 (2007).10.1016/j.ultramic.2006.09.002Google Scholar
[11] Own, C., Sinkler, W., and Marks, L., Ultramicroscopy 107, 534 (2007).10.1016/j.ultramic.2006.03.011Google Scholar
[12] Zuo, J.M. and Mabon, J.C., Web-based Electron Microscopy Application Software: Web-EMAPS, Microsc. Microanal. 10 (Suppl. 2), (2004); URL: http://emaps.mrl.uiuc.edu/.10.1017/S1431927604884319Google Scholar
[13] Wu, J. and Spence, J., Microsc. Microanal. 9, 429 (2000).Google Scholar
[14] Belletti, D., Calestani, G., Gemmi, M., and Migliori, A., Ultramicroscopy 81, 57 (2000).10.1016/S0304-3991(99)00118-7Google Scholar
[15] Vincent, R. and Midgely, P., Ultramicroscopy 53, 271 (1994).10.1016/0304-3991(94)90039-6Google Scholar
[16] Blackman, M., Proc. Roy. Soc., Lond. Ser. A 173, 68 (1939).Google Scholar
[17] Oszlányi, G. and Süto, A., Acta Cryst. A 60, 134 (2004).10.1107/S0108767303027569Google Scholar
[18] Wu, J., Weierstall, U., Spence, J., and Koch, C., Optics Lett. 29, 1 (2004).Google Scholar
[19] Wu, J., Spence, J., O'Keeffe, M., and Groy, T., Acta Cryst. A 60, 326 (2004).10.1107/S0108767304012231Google Scholar
[20] Sheldrick, G.M., SHELXL-97-2, program for crystal structure refinement, University of Göttingen, Germany (1992).Google Scholar
[21] Chapman, H.N., Barty, A., Marchesini, S., Noy, A., Hau-Riege, S.P., Cui, C., Howells, M.R., Rosen, R., He, H., Spence, J.C.H., Weierstall, U., Beetz, T., Jacobsen, C., and Shapiro, D., J. Opt. Soc. Am. A23, 1179 (2006).10.1364/JOSAA.23.001179Google Scholar
[22] Spence, J.C.H., “Diffractive (lensless) imaging” chapter in Science of Microscopy, edited by Hawkes, P. and Spence, J.C.H. (Springer, New York, 2007).Google Scholar