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Automated Scanning Probe Microscopy for Combinatorial Polymer Research

Published online by Cambridge University Press:  26 February 2011

Daan Wouters ,
Alexander Alexeev ,
Dmitri Kozodaev ,
Sergey Saunin  and
Ulrich Schubert
Daan Wouters
Affiliation:
d.wouters@tue.nl
Alexander Alexeev
Affiliation:
u.s.schubert@tue.nl
Dmitri Kozodaev
Affiliation:
u.s.schubert@tue.nl
Sergey Saunin
Affiliation:
u.s.schubert@tue.nl
Ulrich Schubert
Affiliation:
u.s.schubert@tue.nl, Eindhoven University of Technology, P.O. Box 513, Eindhoven, N/A, 5600 MB, Netherlands
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Abstract

With the development of combinatorial materials research (CMR) methods and high throughput experimentation (HTE) workflows for polymer research applications, the demand for automated, high throughput characterization methods is evident. Solution-based characterization methods like NMR, GPC, viscosimetry, for example and UV-Vis as well as fluorescence plate readers are available. Here we report on the incorporation of automated scanning probe microscopy in the HTE-workflow by demonstrating the evaluation of surface properties and topographies for thin polymer film libraries.

Keywords

scanning probe microscopy (SPM)combinatorial synthesismorphology
Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 894: Symposium LL – Combinatorial Methods and Informatics in Materials Science , 2005 , 0894-LL04-03
Copyright
Copyright © Materials Research Society 2006

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References

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