Hostname: page-component-cd9895bd7-lnqnp Total loading time: 0 Render date: 2024-12-28T19:13:02.927Z Has data issue: false hasContentIssue false
  • English
  • Français

Blue Light Emission from Germanium Ultrafine Particles by the Gas Evaporation Technique

Published online by Cambridge University Press:  28 February 2011

Shinji Nozaki ,
S. Sato ,
A. Denda ,
H. Ono  and
H. Morisaki
Shinji Nozaki
Affiliation:
The University of Electro-Communications, Department of Communications and Systems, 1-5-1 Chofugaoka, Chofu-shi, Tokyo 182, Japan
S. Sato
Affiliation:
The University of Electro-Communications, Department of Communications and Systems, 1-5-1 Chofugaoka, Chofu-shi, Tokyo 182, Japan
A. Denda
Affiliation:
The University of Electro-Communications, Department of Communications and Systems, 1-5-1 Chofugaoka, Chofu-shi, Tokyo 182, Japan
H. Ono
Affiliation:
The University of Electro-Communications, Department of Communications and Systems, 1-5-1 Chofugaoka, Chofu-shi, Tokyo 182, Japan
H. Morisaki
Affiliation:
The University of Electro-Communications, Department of Communications and Systems, 1-5-1 Chofugaoka, Chofu-shi, Tokyo 182, Japan
Get access

Abstract

The ultrafine particles with diameters in the order of 10 nm were deposited onto Si and SiO2 substrates by evaporation of Ge in a pure hydrogen atmosphere. Although the as-deposited Ge ultrafine particles do not show any detectable luminescence, they emit blue light after being exposed to the UV light for a long time. The blue light is strong enough to be seen with the naked eye even under a room light. The photooxidation, unique to the Ge ultrafine particles, has been identified as a major factor contributing to the blue light emission.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 358: Symposium F – Microcrystalline and Nanocrystalline Semiconductors , 1994 , 133
Copyright
Copyright © Materials Research Society 1995

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1 Canham, L. T., Appl. Phys. Lett. 57, 1046 (1990).Google Scholar
2 Osaka, Y., Tsunemoto, K., Toyomura, F., Myoren, H. and Kohno, K., Jpn. J. Appl. Phys. 31, L365 (1992)Google Scholar
3 Morisaki, H., Ping, F. W.. Ono, H. and Yazawa, K., J. Appl. Phys. 70, 1869 (1991).Google Scholar
4 Nozaki, S., Sato, S., Ono, H. and Morisaki, H., Mat. Res. Soc. Symp. Proc. 351, 399 (1994).Google Scholar
5 Moulder, J. F., Stickle, W. F., Sobol, P. E. and Bomben, K. D., Handbook of X-Ray Photoelectron Spectroscopy, edited by Chastain, J. (Perkin-Elmer Corp., MN, 1992) p. 223.Google Scholar
6 Harshavardhan, K. S. and Hedge, M. S., Solid State Commun. 69, 117 (1989).Google Scholar
7 Maeda, Y., Tsukamoto, N., Yazawa, Y., Kanemitsu, Y. and Masumoto, Y., Appl. Phys. Lett. 59, 3168 (1991).Google Scholar