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Characterisation of Organic Semiconductor Growth using Real-time Electron Spectroscopy

Published online by Cambridge University Press:  07 March 2011

D. Andrew Evans ,
Owain R. Roberts ,
Gruffudd T. Williams  and
David. P. Langstaff
D. Andrew Evans
Affiliation:
Institute of Mathematics and Physics, Aberystwyth University, Aberystwyth SY23 3BZ, U.K.
Owain R. Roberts
Affiliation:
Institute of Mathematics and Physics, Aberystwyth University, Aberystwyth SY23 3BZ, U.K.
Gruffudd T. Williams
Affiliation:
Institute of Mathematics and Physics, Aberystwyth University, Aberystwyth SY23 3BZ, U.K.
David. P. Langstaff
Affiliation:
Institute of Mathematics and Physics, Aberystwyth University, Aberystwyth SY23 3BZ, U.K.
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Abstract

An organic molecular beam deposition system coupled to a soft x-ray excitation source has been developed to monitor the growth of organic semiconductor thin films in-situ and in real-time. Rapid collection of photoelectron spectra has been enabled using a multichannel array detector coupled to a hemispherical analyzer. The organic semiconductor tin phthalocyanine (SnPc) exhibits a Stranski-Krastanov growth mode on a polycrystalline gold substrate where the transition thickness between layered and clustered growth has been determined to be comparable to the thickness of a single molecular layer within which the molecules are standing on edge relative to the substrate plane.

Keywords

photoemissionsemiconductingthin film
Type
Articles
Information
MRS Online Proceedings Library (OPL) , Volume 1318: Symposium SS/TT/UU/VV – Advances in Spectroscopy and Imaging of Surfaces and Nanostructures , 2011 , mrsf10-1318-uu09-05
Copyright
Copyright © Materials Research Society 2011

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References

REFERENCES

1. Steudel, S., et al. ., Nat Mater 4, 597, (2005).Google Scholar
2. Li, N., et al. ., Appl Phys Lett 94, 023307, (2009).Google Scholar
3. Dediu, V.A., et al. ., Nat Mater 8, 707, (2009).Google Scholar
4. Langstaff, D.P., et al. ., Nucl Instrum Methods B 238, 219, (2005).Google Scholar
5. Evans, D.A., et al. ., J Phys: Condens Matter 21 364223, (2009).Google Scholar
6. Evans, D.A., et al. ., J Vac Sci Technol B 28, C5F5, (2010).Google Scholar