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Characterizing Trace Metal Impurities in Optical Waveguide Materials Using X-Ray Absorption

Published online by Cambridge University Press:  10 February 2011

P. H. Citrin ,
P. A. Northrup ,
R. M. Atkins ,
P. F. Glodis ,
L. Niu ,
M. A. Marcus  and
D. C. Jacobson
P. H. Citrin
Affiliation:
Bell Laboratories, Lucent Technologies, Murray Hill, NJ 07974
P. A. Northrup
Affiliation:
Bell Laboratories, Lucent Technologies, Murray Hill, NJ 07974
R. M. Atkins
Affiliation:
Bell Laboratories, Lucent Technologies, Murray Hill, NJ 07974
P. F. Glodis
Affiliation:
Bell Laboratories, Lucent Technologies, Norcross, GA 30071
L. Niu
Affiliation:
Bell Laboratories, Lucent Technologies, Murray Hill, NJ 07974
M. A. Marcus
Affiliation:
Bell Laboratories, Lucent Technologies, Murray Hill, NJ 07974
D. C. Jacobson
Affiliation:
Bell Laboratories, Lucent Technologies, Murray Hill, NJ 07974
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Abstract

X-ray absorption measurements are described for identifying metal impurities insilica preforms, the rod-like starting materials from which hair-like optical fibers are drawn.The results demonstrate the effectiveness of this approach as a non-destructive,quantitative, element-selective, position-sensitive, and chemical-state-specific means forcharacterizing transition metals in the concentration regime of parts per billion.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 524: Symposium V – Application of Synchrotron Radiation Techniques…IV , 1998 , 251
Copyright
Copyright © Materials Research Society 1998

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References

REFERENCES

[1] Optical Fiber Telecommunications, edited by Miller, S. E. and Chynoweth, A. G. (Academic Press, Inc., New York, 1979), p. 705.Google Scholar
[2] Optical Fiber Communications 1, edited by Li, T. (Academic Press, Inc., New York, 1985), p. 363.Google Scholar
[3] Nagel, S. R., IEEE Circ. Dev. Mag., March 1989, p. 36.Google Scholar
[4] Csenscits, R., Lemaire, P. J. Reed, W. A., Shenk, D. S., and Walker, K. L., Tech. Dig., Opt. Comm. Conf., Feb. 1984.Google Scholar
[5] Nagel, S. R., MacChesney, J. B., and Walker, K. L., IEEE J. Quantum Electron. 18, 459 (1982).Google Scholar
[6] MacDowell, A. A., Hashizume, T., and Citrin, P. H., Rev. Sci. Instrum. 60, 1901 (1989).Google Scholar
[7] Gerward, L., Nucl. Instrum. Methods 181, 11 (1981).Google Scholar
[8] Lee, P. A., Citrin, P. H., Eisenberger, P., and Kincaid, B. M., Rev. Mod. Phys. 53, 769 (1981).Google Scholar
[9] For example, see Schuppler, S., Adler, D. L., Pfeiffer, L. N., West, K. W., Chaban, E. E., and Citrin, P. H., Phys. Rev. B 51, 10527 (1995).Google Scholar