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Published online by Cambridge University Press: 21 March 2011
Grain boundary and crystallographic orientation information of an Al-foil with a columnar grain structure is characterized by Electron Backscattered Diffraction (EBSD) technique. The starting microstructure and grain boundary properties are implemented as an input for the three- dimensional grain growth simulation. In the computational model, minimization of the interface energy is the driving force for the grain boundary motion. The computed evolved microstructure is compared with the final experimental microstructure, after annealing at 550 °C. Good agreement is observed between the experimentally obtained microstructure and the simulated microstructure. The constitutive description of the grain boundary properties was based on a 1- parameter characterization of the variation in mobility with misorientation angle.