Crossref Citations
This article has been cited by the following publications. This list is generated based on data provided by Crossref.
Khelifati, N.
Bouhafs, D.
Mebarek-Azzem, A.
El-Hak Abaidia, S.
Palahouane, B.
and
Kouhlane, Y.
2016.
Adequate Method for Decoupling Bulk Lifetime and Surface Recombination Velocity in Silicon Wafers.
Acta Physica Polonica A,
Vol. 130,
Issue. 1,
p.
188.
Grant, Nicholas E.
and
Murphy, John D.
2017.
Temporary Surface Passivation for Characterisation of Bulk Defects in Silicon: A Review.
physica status solidi (RRL) – Rapid Research Letters,
Vol. 11,
Issue. 11,
Al-Amin, Mohammad
Grant, Nicholas E.
Pointon, Alex I.
and
Murphy, John D.
2019.
Iodine–Ethanol Surface Passivation for Measurement of Millisecond Carrier Lifetimes in Silicon Wafers with Different Crystallographic Orientations.
physica status solidi (a),
Vol. 216,
Issue. 17,