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Comparison of Techniques for Measuring Recombination Lifetime in Photovoltaic Materials: Trapping Effects

Published online by Cambridge University Press:  26 February 2011

Richard K Ahrenkiel ,
Steven W. Johnston  and
Wyatt K Metzger
Richard K Ahrenkiel
Affiliation:
rahren@mac.com, National Renewable Energy Laboratory, National Center for Photovoltaics, 1617 Cole Blvd., Golden, CO, 80401, United States, 303-384-6670, 303-988-8172
Steven W. Johnston
Affiliation:
steve_johnston@nrel.gov, National Renewable Energy Laboratory, Measurements and Characterization Division, 1617 Cole Blvd., Golden, CO, 80401, United States
Wyatt K Metzger
Affiliation:
wyatt_metzger@nrel.gov, National Renewable Energy Laboratory, Measurements and Characterization Division, 1617 Cole Blvd., Golden, CO, 80401, United States
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Abstract

Here we will compare four techniques that are commonly used for diagnosis of the lifetime of photovoltaic materials. The strengths and weaknesses of these techniques will be shown and discussed.

Keywords

semiconductingphotoconductivityphotovoltaic
Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 974: Symposium CC – Solar Energy Conversion , 2006 , 0974-CC01-01
Copyright
Copyright © Materials Research Society 2007

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References

REFERENCES

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