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Crystalline Alignment and In-plane Texture Improvement of Buffer Layers Deposited on NiW Tapes

Published online by Cambridge University Press:  10 March 2011

Linfei Liu ,
Yijie Li ,
Huaran Liu ,
Xiaokun Song ,
Dan Hong ,
Ying Wang  and
Da Xu
Linfei Liu
Affiliation:
Department of Physics, Shanghai Jiao Tong University, Shanghai, Shanghai, China
Yijie Li
Affiliation:
Department of Physics, Shanghai Jiao Tong University, Shanghai, Shanghai, China
Huaran Liu
Affiliation:
Department of Physics, Shanghai Jiao Tong University, Shanghai, Shanghai, China
Xiaokun Song
Affiliation:
Department of Physics, Shanghai Jiao Tong University, Shanghai, Shanghai, China
Dan Hong
Affiliation:
Department of Physics, Shanghai Jiao Tong University, Shanghai, Shanghai, China
Ying Wang
Affiliation:
Department of Physics, Shanghai Jiao Tong University, Shanghai, Shanghai, China
Da Xu
Affiliation:
Department of Physics, Shanghai Jiao Tong University, Shanghai, Shanghai, China
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Abstract

In order to deposit YBCO coated conductor with high critical current densities on rolling assisted biaxially textured Ni-W tapes, this paper has systematically studied the influence of deposition conditions on the orientation, in-plane texture and surface morphology of buffers and superconducting layers. It was found that the crystalline alignment and the in-plane texture of cerium oxide cap-layers were well improved by optimizing deposition parameters. The full width at half maximum of phi-scan x-ray diffraction peaks were reduced from original values of 7-8 degrees to 5-6 degrees. A high critical current density of 4.6×106 A/cm2 has been achieved on optimized buffer layers. This value is comparable with the critical current density of YBCO thin films deposited on single crystalline substrates.

Keywords

superconductingtexturex-ray diffraction (XRD)
Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 1308: Symposium DD – Artificially Induced Crystalline Alignment in Thin Films and Nanostructures , 2011 , mrsf10-1308-dd07-03
Copyright
Copyright © Materials Research Society 2011

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References

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