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Dark Soliton Formation for Light-Induced Waveguiding in Photorefractive inP:Fe

Published online by Cambridge University Press:  10 February 2011

M. Chauvet ,
S. A. Hawkins ,
G. J. Salamo ,
M. Segev ,
D. F. Bliss  and
G. Bryant
M. Chauvet
Affiliation:
Department of Physics, University of Arkansas, Fayetteville, Arkansas 72 701, 501-5 75-5931; 501-575-4580; salamo@comp.uark.edu
S. A. Hawkins
Affiliation:
Department of Physics, University of Arkansas, Fayetteville, Arkansas 72 701, 501-5 75-5931; 501-575-4580; salamo@comp.uark.edu
G. J. Salamo
Affiliation:
Department of Physics, University of Arkansas, Fayetteville, Arkansas 72 701, 501-5 75-5931; 501-575-4580; salamo@comp.uark.edu
M. Segev
Affiliation:
Department of Electrical Engineering and, Advanced Center for Photonics and Optoelectronic Materials, Princeton University Princeton, New Jersey 08544, 609-258-1765; 609-258-4454; segev@EE.Princeton.EDU
D. F. Bliss
Affiliation:
U S. Air Force, Rome Laboratory, Hanscom Air Force Base, Massachusetts 01731617-377-4841; 617-377-7812; bliss@maxwell.rl.plh.af.mil
G. Bryant
Affiliation:
U S. Air Force, Rome Laboratory, Hanscom Air Force Base, Massachusetts 01731617-377-4841; 617-377-7812; bliss@maxwell.rl.plh.af.mil
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Abstract

We present experimental evidence for the observation of steady-state dark photorefractive screening solitons trapped in bulk InP:Fe.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 484: Symposium F – Infrared Applications of Semiconductors II , 1997 , 491
Copyright
Copyright © Materials Research Society 1998

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References

1. Segev, M., Crosignani, B., Yariv, A., and Fisher, B., Phys. Rev. Lett. 68, 923 (1992).Google Scholar
2. Duree, G., Shultz, J.L., Salamo, G., Segev, M., Yariv, A., Crosignani, B., Porto, P. Di, Sharp, E., and Neurgaonkar, R.R., Phys. Rev. Lett. 71, 533 (1993); Phys. Rev. Lett. 74, 1978 (1995).Google Scholar
3. Iturbe-Castillo, M.D., Aguilar, P.A. Marquez, Sanchez-Mondragon, J.J., Stepanov, S., and Vysloukh, V., Appl. Phys. Lett. 64, 408 (1994).Google Scholar
4. Segev, M., Valley, G.C., Crosignani, B., Porto, P. Di, and Yariv, A., Phys. Rev. Lett. 74, 1978 (1995).Google Scholar
5. Christodoulides, D.N. and Carvalho, M.J., J. Opt. Soc. Am. 12, 1628 (1995).10.1364/JOSAB.12.001628Google Scholar
6. Shih, M.F., Segev, M., Valley, G.C., Salamo, G., Crosignani, B., and Porto, P. Di, Electron. Lett. 31, 826 (1995).Google Scholar
7. Aitchison, J.S., Opt. Lett. 15, 471 (1990).Google Scholar
8. Chauvet, M., Hawkins, S., Salamo, G., Segev, M., Bliss, D. and Bryant, G., Opt. Lett. 21, 1333 (1996).Google Scholar
9. Chauvet, M., Hawkins, S., Salalmo, G., Segev, M., Bliss, D. and Bryant, G., Appl. Phys. Lett. 70, 2499 (1997).Google Scholar
10. Picoli, G., Gravey, P., Ozkul, C., and Vieux, V., J. Appl. Phys. 66, 3798 (1989).Google Scholar