Published online by Cambridge University Press: 01 February 2011
Strain-rate jump tests in compression are carried out on nanostructured copper (grain size = 90 nm) at moderate temperatures (353K - 393K). Strain-rate sensitivity m is measured as a function of temperature, T, and strain rate, έ. Increasing temperature or decreasing strain rate induces an increase in the strain-rate sensitivity. For (έ, T) = (1×10-5 s-1, 393K), m is equal to 0.17 which is the highest value reported for nanocrystalline copper. These results of enhanced m are encouraging in terms of gain in ductility. The measurements emphasize the existence of a thermally activated mechanism different from the normal rate-controlling process observed for microcrystalline fcc metals.