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Determination of the Real Indenter Shape for Nanoindentation/Nanotribology Tests by Surface Metrological and Analytical Investigations

Published online by Cambridge University Press:  17 March 2011

S. Enders ,
P. Grau  and
H. M. Hawthorne
S. Enders
Affiliation:
NRC Innovation Centre, Surface Technology-Tribology Group, Vancouver, Canada
P. Grau
Affiliation:
Martin-Luther-University Halle-Wittenberg, FB Physik-ExPh I, D-06108 Halle, Germany
H. M. Hawthorne
Affiliation:
NRC Innovation Centre, Surface Technology-Tribology Group, Vancouver, Canada
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Abstract

In this paper a critical comparison of different kinds of surface metrological methods like atomic force microscopy (AFM), scanning electron microscopy (SEM) and optical interferometric profilometry is made, as well as analytical investigations based on both Hertz and Sneddon theories of pure elastic contact, to qualify the real indenter shape function. The results obtained show the advantages and disadvantages of the respective methods by describing a rounded indenter tip.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 649: Symposium Q – Fundamentals of Nanoindentation & Nanotribology II , 2000 , Q3.6
Copyright
Copyright © Materials Research Society 2001

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References

REFERENCES

[1] Herrmann, K., Haschke, K., Pohlenz, F., Seemann, R., Menelao, F., presented at the MicroMat 2000, Berlin,2000 ( to be published)Google Scholar
[2] Pethica, J.B., Oliver, W.C.: Mat.Res.Soc. Symp.Proc. 130, 13, (1989)Google Scholar
[3] Sneddon, I.N.: Int.J.Enging.Sci. 3, 47, (1965)Google Scholar
[4] Bolshakov, A., Oliver, W.C., Pharr, G.M.: Mat.Res.Soc. Symp.Proc. 356, 675, (1995)Google Scholar
[5] Grau, P., Meinhard, H., Mosch, S.: Mat.Res.Soc. Symp. Proc. 522, 153,(1998)Google Scholar
[6] WYCO Surface Profilers, Technical Reference ManualGoogle Scholar