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Development of Ferroelectric Data Storage Test System for High-Density and High-speed Read/Write

Published online by Cambridge University Press:  31 January 2011

Yoshiomi Hiranaga ,
Kenkou Tanaka ,
Tomoya Uda ,
Yuichi Kurihashi ,
Yasuhiro Kimoto ,
Hikari Tochishita ,
Michio Kadota  and
Yasuo Cho
Yoshiomi Hiranaga
Affiliation:
hiranaga@riec.tohoku.ac.jp, Tohoku University, Research Institute of Electrical Communication, Sendai, Japan
Kenkou Tanaka
Affiliation:
kenkou@riec.tohoku.ac.jp, Tohoku University, Research Institute of Electrical Communication, Sendai, Japan
Tomoya Uda
Affiliation:
uda@riec.tohoku.ac.jp, Tohoku University, Research Institute of Electrical Communication, Sendai, Japan
Yuichi Kurihashi
Affiliation:
kurihasi@riec.tohoku.ac.jp, Tohoku University, Research Institute of Electrical Communication, Sendai, Japan
Yasuhiro Kimoto
Affiliation:
kimoto-y@riec.tohoku.ac.jp, Tohoku University, Research Institute of Electrical Communication, Sendai, Japan
Hikari Tochishita
Affiliation:
kimoto-y@riec.tohoku.ac.jp, Tohoku University, Research Institute of Electrical Communication, Sendai, Japan
Michio Kadota
Affiliation:
hikari@murata.co.jp, Murata Manufacturing Co., Ltd., Yasu, Shiga, Japan
Yasuo Cho
Affiliation:
kadota@murata.co.jp, Murata Manufacturing Co., Ltd., Yasu, Shiga, Japan
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Abstract

In this study, we have developed ferroelectric data storage test systems based on scanning nonlinear dielectric microscopy (SNDM) to conduct various experiments concerning read/write capability. Nanodomain formation on ferroelectric recording media was studied using the data storage test system. A nanodomain dot array was successfully written on a single-crystal LiTaO3 recording medium. The diameter of the written dot was as small as 7 nm. Epitaxial-thin-film LiTaO3 recording media were also developed. Nanodomain dots with the diameter of 25 nm were written on the thin-film recording medium. In addition, a non-contact probe-height control technique was adopted to solve the problem of tip abrasion using higher-order nonlinear dielectric response detection method. Finally, a hard-disk-drive (HDD)-type ferroelectric data storage test system was developed for conducting read/write tests under conditions close to those of actual operation. Capabilities of reading at the bit rate of 2 Mbps and writing at the bit rate of 20 Mbps were confirmed using the HDD-type data storage test system.

Keywords

ferroelectricstoragescanning probe microscopy (SPM)
Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 1199: Symposium F –Multiferroic and Ferroelectric Materials , 2009 , 1199-F10-09
Copyright
Copyright © Materials Research Society 2010

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