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Dielectric Properties of UV Cured Thick Film Polymer Networks through High Power Xenon Flash Lamp Curing

Published online by Cambridge University Press:  29 January 2014

Brian C. Riggs ,
Ravinder Elupula ,
Venkata S. Puli ,
Scott M. Grayson  and
Douglas B. Chrisey
Brian C. Riggs
Affiliation:
Department of Physics and Engineering Physics, Tulane University, New Orleans, LA 70118
Ravinder Elupula
Affiliation:
Department of Chemistry, Tulane University, New Orleans, LA 70118
Venkata S. Puli
Affiliation:
Department of Physics and Engineering Physics, Tulane University, New Orleans, LA 70118
Scott M. Grayson
Affiliation:
Department of Chemistry, Tulane University, New Orleans, LA 70118
Douglas B. Chrisey
Affiliation:
Department of Physics and Engineering Physics, Tulane University, New Orleans, LA 70118
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Abstract

High-energy flash cure lamps process thick film materials (<10 um) over large areas (<100 cm2) within milliseconds and are capable to deliver higher energy and power densities (20 J/cm2 and 20 kW/cm2) allowing for a more complete curing and elimination of flaws that would exist in conventional treatment. Click reactions are especially attractive for patterned devices as they have minimal shape change during curing and have a more predictable structure compared to free radical acrylate polymerization. Pentaerythritol tetrakis(3-mercaptopropionate) and 2,4,6-Triallyloxy-1,3,5-triazine were combined at 3:4 by weight and then spin coated on copper foil substrates. The solutions were processed both thermally and with exposure to a xenon flash bulb. Thermal treatment consisted of heating the sample at 80°C on a hot plate over night. Flash curing was accomplished using a Novacentrix Pulseforge 1300 system. The flash lamp curing fluence and intensities were varied to determine their effects on degree of cross-linking, dielectric constant, breakdown field and energy storage. The degree of cross-linking was determined through comparative FTIR studies. Dielectric constant was measured using an Agilent 4294a impedance analyzer from 100 Hz-100 MHz with a two terminal setup. Breakdown strength and energy density measurements were taken using Radiant Technology's Precision Ferroelectric tester with a 10 kV source. The printed films averaged 1-3 microns thick as observed by an SEM cross section measurement. It was found that dielectric constant varies with both treatment intensity and fluence. Energy densities were calculated using the ideal capacitor equation and ranged from 1.5-4.8 J/cm3.

Keywords

energy storagephotochemicaldielectric properties
Type
Articles
Information
MRS Online Proceedings Library (OPL) , Volume 1630: Symposium O – Solution Processing of Inorganic and Hybrid Materials for Electronics and Photonics , 2014 , mrsf13-1630-o06-38
Copyright
Copyright © Materials Research Society 2014 

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