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Digital Image Processing and MEB (BSE) Techniques in the Identification and Quantification of Minerals Phases Present in Cement and Concrete

Published online by Cambridge University Press:  01 February 2011

Nicanor Prendes  and
Esperanza Menéndez
Nicanor Prendes
Affiliation:
nprendes@cedex.es, cedex-Ministerio de Fomento, Mineralogy and Petrology, C/ Antonio López, nº 81,, Madrid, 28014, Spain, 91.335.7672, 91.335.7622
Esperanza Menéndez
Affiliation:
e.menedez@eitcc.es, Instituto Torroja, Materials, Madrid, 28021, Spain
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Abstract

The generation processes of microscopic images in as Backscattered Scanning Electrons (BSE) are produced by complex interaction between incident electrons beam within the specimen. Different authors have correlated the energy of impact released with the mean atomic number (Z) of the phase to study, and deducing that the nature of the scattering events induced by the electron beam is strongly controlled by the Z value of them. If we compared the amount of electron backscattering with respect to response of the beam energies and so deduced a mathematical functions, for each specimen studied, and respectively by to digital images processing (based on the linear transformation of levels grey range in those energies) allows to sharpen in the discrimination and quantification of some phases in cements that, due to overlap processes, until now, could not be isolated. By means theses theoretical studios it is possible, for example, to identify interstitial cations that impinge on Z factor of phase deducing for each types of energies answer a series of mathematical functions, fitting a coefficient and across digital image techniques allows to sharpen in the discrimination and quantification of certain phases in cements that, as well, is noted in grey levels of digital image. In electron microscope have to settle down a strict work conditions (DW=10 mm, V0=20 KeV), and from a pattern specimen, found the grey level of image histogram for those working conditions, and fitting to the linear function, even if operated with BSE, the theoretic phases deduced from the EDX and the quantitative analysis of the stoichiometric formula. Given a coefficient (ç) its effective Z it's calculated; the deviation, therefore, gives the interstitial cations presence. With this tool, for example, the ettringite of gypsum is discriminates; or C-S-H products and the C3S. Once obtained the greys levels image of surface to examine and by means of threshold images process (a value of limit grey level or phase identification) he is immediate to obtain stereological relations (working with planar surfaces, which facilitate the treatment and the development of algorithms of mathematical morphology) and quantitative character phases of each phase

Keywords

scanning electron microscopy (SEM)molecular weightoptoelectronic
Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 1026: Symposium C – Quantitative Electron Microscopy for Materials Science , 2007 , 1026-C04-04
Copyright
Copyright © Materials Research Society 2008

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References

Bishop, H. E. 1966. “Some Electron Backscattering Measurement for solid Target”. In X-Ray Optics and Microanalysis. Editions by Hermann, . Pp 159–167.Google Scholar
Bishop, H. E. 1976. “Electron-Solid Interactions and Energy Dissipation”. Cp 2. In Quantitative Scanning Electron Microscopy. Edited by Holt, D. B., Muir, M. D., Grant, P. R. & Boswarva, I. M. Academic Press. Inc. London Ltd. Pps 41–64.Google Scholar
Flegler, S. L., Heckman, J. W. Jr & Klomparens, K. L. 1993. Scanning and Transmission Electron Microscopy. An Introduction. Edited by Freeman, W.H. and Company, N.Y. printed in USA. 225 pps.Google Scholar
Friel, J. J. & Barbi, N. C. 1997. X-Ray Microanalysis and Computer-aided Imaging. Edited by PGT. Princeton Gamma-Tech, Inc. Princeton. 89 pps.Google Scholar
Goldstein, J. I., Newbury, D. E., Echlin, P., Joy, D. C., Fiori, C. & Lifshin, E. 1984. Scanning Electron Microscopy and X-Ray Microanalysis.Plenum Press, N.Y. 2nd Ed. 673 pp.Google Scholar
Heinrich, K. F. J. 1966. “Electron Probe Microanalysis by Specimen Current Measurement”. In X-Ray Optics and Microanalysis. Editions by Hermann. Pp 159–167.Google Scholar
Kjellsen, K. O., Detwiler, R. J. & Gjφrv, . 1991. “Backscattered Electron Image Analysis of Cement Paste Specimens: Specimen Preparation and Analytical Methods””. In Cement and Concrete Research. Printed in USA. Pergamon Press Plc. Vol. 21. pps 388–390.Google Scholar
Krinsley, D. H., Pye, K, Boggs, S. Jr & Tovey, N. K. 1998. Backscattered Scanning Electron Microscopy and Images Analysis of Sediments and Sedimentary Rocks. Cambridge University Press. Printed in USA. 1st edition. 193 pps.10.1017/CBO9780511628894Google Scholar
Lange, D. A., Jenning, H. M. & Shah, S. 1994. “Image Analysis Techniques for Characterization of Pore Structure of Cement-Based Materials” in Cement and Concrete Research. Edited by Elsevier Sciences Ltd. Printed in USA. Vol. 24. n° 5. pps 741–853.Google Scholar
Murr, L. E. 1991. Electron and Ion Microscopy and Microanalysis. Principles and Applications. Editor Thompson, B. J. 2nd Edition Revised and Expanded. Marcel Dekker, Inc. N.Y. 837 pps.Google Scholar
Newbury, D. E., Joy, D. C., Echlin, P., Fiori, C. E. & Goldstein, J. I. 1987. Advanced Scanning Electron Microscopy and X-Ray Microanalysis. Edited by Plenum Press. N.Y. 2nd Edition. 454 pps.Google Scholar
Newbury, D. E. 1989. “Electron Beam-Specimen Interactions in the Analytical Electron Microscope”. In Principles of Analytical Electron Microscopy. Ed. Joy, D. C., Romig, a. D. Jr & Goldstein, J. I. Plenum Press, N. Y. Cp 1. pps 1–27.Google Scholar
Northrop, D. C. 1973.“The Interaction of Electrons with Solids”. In The Use of the Scanning Electron Microscope. Edited by Hearle, J. W. S., Sparrow, J. T. and Cross, P. M. Pergamon Press. Reprintd to 1st editions. Chp 2. pps 24–48.Google Scholar
Prendes, N. 2005. Determinación de Parámetros Petrográficos en Cementos y Hormigones por Tratamiento Digital de Imágenes. Tesis Doctoral. Universidad de Oviedo.(Inédita).Google Scholar
Russ, J. C. 1995. The Image Processing. 2nd Edition. CRC Press, Inc. 674 pps.Google Scholar
Underwood, E. E. 1970. Quantitative Stereology. Addison- Wesley Publishing Company. Inc. Massachussets. 274 pps.Google Scholar
Welton, J. E. 1984. SEM Petrology Atlas. Published by The American Association of Petroleum Geologist. Tulsa Oklahoma. 237 pps.Google Scholar