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Dislocation Nucleation from a Surface CUSP
Published online by Cambridge University Press: 15 February 2011
Abstract
Theoretical and experimental studies have suggested that surface roughness may significantly enhance the nucleation of misfit dislocations in a strained heteroepitaxial film, especially in view of a stress-induced roughening instability which tends to form cusp-like stress singularities along the film surface. In this paper, the process of dislocation nucleation is perceived as a single dislocation emerging from a gradually sharpening surface groove. An analysis similar to the Rice-Thomson model for dislocation nucleation from a crack tip is carried out to determine the nucleation condition in terms of the depth and curvature of the surface groove. Specific applications are made to Si1−xGex alloy films on Si (100) substrates.
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- Copyright © Materials Research Society 1994
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