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Dislocation Threading Through an Epitaxial Film: an Analysis Based on the Peierls-Nabarro Concept

Published online by Cambridge University Press:  15 February 2011

G. E. Beltz  and
L. B. Freund
G. E. Beltz
Affiliation:
Division of Engineering, Brown University, Providence, Rhode Island 02912
L. B. Freund
Affiliation:
Division of Engineering, Brown University, Providence, Rhode Island 02912
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Abstract

The Peierls-Nabarro theory of crystal dislocations is applied to estimate the critical thickness of a strained layer bonded to a substrate for a given mismatch strain. Previous analyses were based on the continuum theory of elastic dislocations, and hence depended on the artificial core cutoff parameter r0. The Peierls-Nabarro theory makes use of an interplanar shear law, which leads to a more realistic description of the stresses and displacements in the vicinity of a dislocation core, thus eliminating the need for the core cutoff parameter. The dependence of the critical layer thickness on the mismatch strain in films with a diamond cubic lattice is found to be similar to that predicted by the continuum elastic dislocation theory, provided that a core cutoff radius equal to about one-tenth the Burgers displacement is used.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 308: Symposium M1 – Thin Films: Stresses and Mechanical Properties IV , 1993 , 395
Copyright
Copyright © Materials Research Society 1993

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References

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