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Dislocations in Submicron Grain Size and Nanocrystalline Copper

Published online by Cambridge University Press:  14 March 2011

T. Ungár ,
G. Tichy ,
P. G. Sanders  and
J. R. Weertman
T. Ungár
Affiliation:
Dept. of General Phys., Eötvös University Budapest, H-1518, P.O.B. 32, Budapest, Hungary
G. Tichy
Affiliation:
Dept. of Solid State Phys., Eötvös University Budapest, H-1518, P.O.B. 32, Budapest, Hungary
P. G. Sanders
Affiliation:
Harvard University, 402 Gordon McKay, 9 Oxford St, Cambridge, MA, 02138, U.S.A.
J. R. Weertman
Affiliation:
Dept. of Mater. Sci. and Eng., Northwestern University Evanston, IL, 60208, U.S.A.

Abstract

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Using the dislocation model of strain anisotropy in X-ray diffraction peak profile analysis it is shown that in nanocrystalline copper produced by inert gas condensation dislocations are present, at least, down to average grain sizes of the order of 20 nm. Based on the analysis of the dislocation contrast factors it is suggested that with decreasing grain size the proportion of Lomer-Cottrell type dislocations increases.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 634: Symposium B – Structure and Mechanical Properties of Nanophase Materials-Theory & Computer Simulations vs. Experiment , 2000 , B1.7.1
Copyright
Copyright © Materials Research Society 2001

References

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