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Published online by Cambridge University Press: 01 February 2011
The general methodology of calculating linear and nonlinear properties of nanoporous and nanostructured semiconductor materials and composites is presented. A Maxwell-Garnett approach is generalized for the case of porous semiconductor materials composed of a number of differently oriented pore lattices. Specifically, the cases of electrochemically etched mesoporous silicon on (110)-oriented substrate and electrochemically-etched porous InP and GaAs materials on (100) substrates are considered. The observed optical anisotropy of mesoporous Si is explained. A biaxial anisotropy of the porous InP or GaAs material with crystallographic pores is predicted.