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The Effects of Structure on the Formation of Schottky Barriers at Nanoparticle-Oxide Interfaces

Published online by Cambridge University Press:  27 February 2013

Ramsey Kraya  and
Laura Y. Kraya
Ramsey Kraya
Affiliation:
Department of Materials Science and Engineering, University of Pennsylvania, Philadelphia, PA, 19104 U.S.A.
Laura Y. Kraya
Affiliation:
Department of Materials Science and Engineering, University of Pennsylvania, Philadelphia, PA, 19104 U.S.A.
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Abstract

The surface structure of oxide materials may be the limiting factor in controlling switching properties at interfaces. Here we investigate and correlate the surface structure and electronic properties of BaTiO3 substrates. By using low energy electron diffraction and scanning tunneling microscopy we are able to identify surface reconstructions based on annealing treatments. We then investigate the effect of contact size on the transport properties on oxide surfaces utilizing atomic force microscopy. Our results show the critical importance of controlling surface structure to optimize electronic properties at oxide interfaces.

Keywords

oxidescanning probe microscopy (SPM)nanostructure
Type
Articles
Information
MRS Online Proceedings Library (OPL) , Volume 1494: Symposium Z – Oxide Semiconductors and Thin Films , 2013 , pp. 311 - 314
Copyright
Copyright © Materials Research Society 2013 

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References

REFERENCES

Xu, Y., Ferroelectric Materials and Their Applications: North Holland, 1991.Google Scholar
Kraya, L. Y. and Kraya, R., “Determination of the electronic structure of ferroelectric surfaces by scanning tunneling microscopy,” Journal of Applied Physics, vol. 111, 2012.CrossRefGoogle Scholar
Nilius, N., “Properties of oxide thin films and their adsorption behavior studied by scanning tunneling microscopy and conductance spectroscopy,” vol. 64, pp. 595–659, 1 December 2009 2009.CrossRefGoogle Scholar
Kraya, R. and Kraya, L., “The role of contact size on the formation of Schottky barriers and ohmic contacts at nanoscale metal-semiconductor interfaces,” Journal of Applied Physics, vol.111, p. 4, 2012.CrossRefGoogle Scholar
Kraya, R. A. and Bonnell, D. A., “Determining the Electronic Properties of Individual Nanointerfaces by Combining Intermittent AFM Imaging and Contact Spectroscopy,” Ieee Transactions on Nanotechnology, vol. 9, pp. 741–744, Nov 2010.CrossRefGoogle Scholar
Kraya, R., Kraya, L. Y., and Bonnell, D. A., “Orientation Controlled Schottky Barrier Formation at Au Nanoparticle-SrTiO3 Interfaces,” Nano Letters, vol. 10, pp. 1224–1228, Apr 2010.CrossRefGoogle ScholarPubMed
Kraya, R. A. and Kraya, L. Y., “Controlling the Interface Dynamics at Au Nanoparticle - Oxide Interfaces,” Nanotechnology, IEEE Transactions on, vol. 11, p. 3, 2012.CrossRefGoogle Scholar