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Estimation of Local Current Transport Properties in Thin Film Superconductor Based on Scanning Hall-probe Microscopy

Published online by Cambridge University Press:  11 December 2012

Kohei Higashikawa
Affiliation:
Department of Electrical Engineering, Graduate School of ISEE, Kyushu University, 744 Motooka, Nishi-ku, Fukuoka 819-0395, Japan
Kei Shiohara
Affiliation:
Department of Electrical Engineering, Graduate School of ISEE, Kyushu University, 744 Motooka, Nishi-ku, Fukuoka 819-0395, Japan
Masayoshi Inoue
Affiliation:
Department of Electrical Engineering, Graduate School of ISEE, Kyushu University, 744 Motooka, Nishi-ku, Fukuoka 819-0395, Japan
Takanobu Kiss
Affiliation:
Department of Electrical Engineering, Graduate School of ISEE, Kyushu University, 744 Motooka, Nishi-ku, Fukuoka 819-0395, Japan
Masateru Yoshizumi
Affiliation:
Superconductivity Research Laboratory, International Superconductivity Technology Center, 1-10-13 Shinonome, Koto-ku, Tokyo 135-0062, Japan
Teruo Izumi
Affiliation:
Superconductivity Research Laboratory, International Superconductivity Technology Center, 1-10-13 Shinonome, Koto-ku, Tokyo 135-0062, Japan
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Abstract

To enhance a global critical current in a superconductor, it is indispensable to understand current limiting factors and their influence on such a critical current. From this point of view, we have investigated in-plane distribution of local critical current density and its electric field criterion in a thin-film superconductor by using scanning-Hall probe microscopy. In a remanent state, after the application of sufficiently high magnetic field to a sample, current flows at critical current density according to the critical state model. Such distribution of current density was estimated from that of measured magnetic field using the Biot-Savart law. Furthermore, the corresponding electric field criterion was evaluated from the relaxation of such remanent magnetic field by considering Faraday’s law. This means that we could estimate in-plane distribution of local critical current density as a function of electric field criterion in a nondestructive manner. This characterization method would be very helpful for finding current limiting factors in a thin-film superconductor and their influence on its global current density versus electric field properties which would usually be obtained by four-probe method.

Type
Articles
Copyright
Copyright © Materials Research Society 2012

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References

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