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Evaluation of Four Imaging Techniques for the Electrical Characterization of Solar Cells

Published online by Cambridge University Press:  21 March 2011

Gregory M. Berman ,
Nathan J. Call ,
Richard K. Ahrenkiel  and
Steven W. Johnston
Gregory M. Berman
Affiliation:
Department of Electrical Engineering, University of Colorado, Boulder, CO 80309, U.S.A. National Renewable Energy Laboratory, Golden, CO 80401, U.S.A.
Nathan J. Call
Affiliation:
Department of Materials Science, Colorado School of Mines, Golden, CO 80401, U.S.A. National Renewable Energy Laboratory, Golden, CO 80401, U.S.A.
Richard K. Ahrenkiel
Affiliation:
Department of Materials Science, Colorado School of Mines, Golden, CO 80401, U.S.A. National Renewable Energy Laboratory, Golden, CO 80401, U.S.A.
Steven W. Johnston
Affiliation:
National Renewable Energy Laboratory, Golden, CO 80401, U.S.A.
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Abstract

We evaluate four techniques that image minority carrier lifetime, carrier diffusion length, and shunting in solar cells. The techniques include photoluminescence imaging, carrier density imaging, electroluminescence imaging, and dark lock-in thermography shunt detection. We compare these techniques to current industry standards and show how they can yield similar results with higher resolution and in less time.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 1123: Symposium P – Photovoltaic Materials and Manufacturing Issues , 2008 , 1123-P03-08
Copyright
Copyright © Materials Research Society 2009

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