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Expanded Thermochromic Color Changes in VO2 Thin Film Devices Using Structured Plasmonic Metal Layers

Published online by Cambridge University Press:  15 February 2013

Yan Wang  and
John F. Muth
Yan Wang
Affiliation:
Department of Electrical and Computer Engineering, North Carolina State University, Raleigh, North Carolina 27695, USA Department of Physics, North Carolina State University, Raleigh, North Carolina 27695, USA
John F. Muth
Affiliation:
Department of Electrical and Computer Engineering, North Carolina State University, Raleigh, North Carolina 27695, USA
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Abstract

We investigate metallic thin films on VO2 and show that the magnitude of the reflected color change in that visible portion of the spectrum as VO2 undergoes the insulating to metallic phase transition can be controlled by changing the type of metal, the thickness of the metal and by patterning the metal at the nano scale. We consider the role of surface plasmas in the metal film and show that in the near infrared, the magnitude of the reflectivity increase for metal coated VO2 films, but decrease for uncoated VO2 thin films. This is explained in the context of Fresnel equations and considering the large change in the imaginary part of the dielectric constant as the VO2 changes state from the insulating to metallic phase.

Keywords

metal-insulator transitionthin filmoptical properties
Type
Articles
Information
MRS Online Proceedings Library (OPL) , Volume 1494: Symposium Z – Oxide Semiconductors and Thin Films , 2013 , pp. 171 - 177
Copyright
Copyright © Materials Research Society 2013 

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References

REFERENCES

Granqvist, C., Thin Solid Films 193, 730–741 (1990).CrossRefGoogle Scholar
Mlyuka, N.R., Niklasson, G. a., and Granqvist, C.G., Physica Status Solidi (a) 206, 2155 (2009).CrossRefGoogle Scholar
Tazawa, M., Yoshimura, K., Jin, P., and Xu, G., Applied Physics A: Materials Science & Processing 77, 455 (2003).CrossRefGoogle Scholar
Li, S.-Y., Niklasson, G. a., and Granqvist, C.G., Journal of Applied Physics 108, 063525 (2010).CrossRefGoogle Scholar
Maaza, M., Nemraoui, O., Sella, C., Beye, A.C., Box, P.O., Africa, S., Pierre, U., Curie, M., Vi, P., and Cedex, P., Gold Bulletin 100 (2005).CrossRefGoogle Scholar
Lou, Y., Lunardi, L.M., and Muth, J.F., Sensors Journal, IEEE 10, 617–620 (2010).CrossRefGoogle Scholar
Lou, Y., Doctor of Philosophy Dissertation, North Carolina State University (2011)Google Scholar