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Extreme Phonon Softening in Laser-excited Bismuth – Towards an Inverse Peierls-transition

Published online by Cambridge University Press:  31 January 2011

Wei Lu ,
Matthieu Nicoul ,
Uladzimir Shymanovich ,
Alexander Tarsevitch ,
Martin Kammler ,
Michael Horn-von Hoegen ,
Dietrich von der Linde  and
Klaus Sokolowski-Tinten
Wei Lu
Affiliation:
wei.lu@uni-due.de, Universität Duisburg-Essen, Duisburg, Germany
Matthieu Nicoul
Affiliation:
matthieu.nicoul@uni-koeln.de, Universität Duisburg-Essen, Duisburg, Germany
Uladzimir Shymanovich
Affiliation:
uladzimir.shymanovich@uni-due.de, Universität Duisburg-Essen, Duisburg, Germany
Alexander Tarsevitch
Affiliation:
alexander.tarasevitch@uni-due.de, Universität Duisburg-Essen, Duisburg, Germany
Martin Kammler
Affiliation:
martin.kammler@uni-due.de, Universität Duisburg-Essen, Duisburg, Germany
Michael Horn-von Hoegen
Affiliation:
horn-von-hoegen@uni-due.de, United States
Dietrich von der Linde
Affiliation:
dietrich.von-der-linde@uni-due.de, Universität Duisburg-Essen, Duisburg, Germany
Klaus Sokolowski-Tinten
Affiliation:
Klaus.Sokolowski-Tinten@uni-due.de
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Abstract

Large amplitude coherent optical phonons have been investigated in laser-excited Bismuth by means of femtosecond time-resolved X-ray diffraction. For absorbed laser fluences above 2 mJ/cm2, the experimental data reveal an extreme softening of the excited A1g-mode down to frequencies of about 1 THz, only 1/3 of the unperturbed A1g-frequency. At even stronger excitation the measured diffraction signals no longer exhibit an oscillatory behavior presenting strong indication that upon intense laser-excitation the Peierls-distortion, which defines the equilibrium structure of Bismuth, can be transiently reversed.

Keywords

x-ray diffraction (XRD)Biphase transformation
Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 1230: Symposium MM – Ultrafast Processes in Materials Science , 2009 , 1230-MM03-05
Copyright
Copyright © Materials Research Society 2010

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References

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