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Fabrication and Surface Morphology of YBCO Superconducting Thin films on STO Buffered Si Substrates

Published online by Cambridge University Press:  29 May 2012

Zafer Mutlu ,
Yasar G. Mutlu ,
Mucahit Yilmaz ,
Oguz Dogan ,
Mihrimah Ozkan  and
Cengiz S. Ozkan
Zafer Mutlu
Affiliation:
Department of Materials Science & Engineering, University of California-Riverside, Riverside, CA 92521, USA
Yasar G. Mutlu
Affiliation:
Department of Physics, Selcuk University, Selcuklu, 42079, Turkey
Mucahit Yilmaz
Affiliation:
Department of Physics, A. K. Education Faculty, Konya University, Konya, 42090, Turkey
Oguz Dogan
Affiliation:
Department of Physics, A. K. Education Faculty, Konya University, Konya, 42090, Turkey
Mihrimah Ozkan
Affiliation:
Department of Electrical Engineering, University of California-Riverside, Riverside, CA 92521, USA
Cengiz S. Ozkan
Affiliation:
Department of Materials Science & Engineering, University of California-Riverside, Riverside, CA 92521, USA Department of Mechanical Engineering, University of California-Riverside, Riverside, CA 92521, U.S.A
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Abstract

Pulsed Electron Deposition (PED) is an attractive alternative to Pulsed Laser Deposition (PLD) for growing high temperature superconductor thin films because of its relatively low cost. In this study, YBa2Cu3O7-δ(YBCO) thin film has been fabricated on silicon substrates by Pulsed Electron Deposition technique. SrTiO3 (STO) as a buffer layer has been grown between Si substrate and YBCO superconducting layer. The crystalline structures of STO/Si and YBCO/STO/Si films have been investigated by x-ray diffraction (XRD). The surface morphology and microstructure of YBCO/STO/Si thin film have been characterized with atomic force microscope (AFM) and scanning electron microscope (SEM). From the θ-2θ XRD analysis of YBCO thin films, (00l) diffraction peaks are obtained indicating they have a poor c-axis oriented structure. SEM analysis shows that the surfaces of films are crack-free, but they have some particulates. On AFM images, the droplets are clearly observed leading to a roughly surface.

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Articles
Information
MRS Online Proceedings Library (OPL) , Volume 1454: Symposium HH – Nanocomposites, Nanostructures and Heterostructures of Correlated Oxide Systems , 2012 , pp. 129 - 134
Copyright
Copyright © Materials Research Society 2012

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References

REFERENCES

Mathis, J. E., and Christen, H. S., Physica C, 459 47 (2007).CrossRefGoogle Scholar
Zanettini, S. et al. ., Cryst. Res. Technol. 46, No. 8, 881 – 884 (2011).CrossRefGoogle Scholar
Giliol, E. et al. ., J. of Physics: Conference Series 97 (2008).Google Scholar
Jiang, Q. D. et al. ., Thin Solid Films, 241, 100 (1994).CrossRefGoogle Scholar
Zhai, H.Y. et al. ., “Pulsed Electron Deposition for Coated Conductor Applications”, Materials Research Society Symposia Proceedings (2004).Google Scholar
Dought, C. et al. ., Appl. Phys. Lett. 66, 1276 (1995).CrossRefGoogle Scholar
Lai, T. S. et al. ., J. Phys. 31, 32 (1998).Google Scholar
Ko, K. P. et al. ., IEEE Transaction on Applied Superconductivity, 15 2, 3054, (2005).CrossRefGoogle Scholar
Kovaleski, S. D. et al. ., Journal of Applied Physics, 86(1999).CrossRefGoogle Scholar
Vasco, E. et al. ., Applied Surface Science, 208–209 (2003).Google Scholar
Prijamboedi, B. et al. ., Journal of Crystal Growth 283 (2005).CrossRefGoogle Scholar
Kusumori, T., Mutor, H. Physica C 337 2000 Page 59.CrossRefGoogle Scholar