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Fabrication of a Bimodal Ferromagnetic Nanosystem in an Etched Silicon Structure and its Magnetic and Magneto-Optic Characterization

Published online by Cambridge University Press:  01 February 2011

P. Granitzer ,
K. Rumpf ,
P. Pölt ,
A. Reichmann ,
S. Surnev  and
H. Krenn
P. Granitzer
Affiliation:
Institute of Physics, Karl-Franzens-University Graz, Universitaetsplatz 5, A-8010 Graz, Austria
K. Rumpf
Affiliation:
Institute of Physics, Karl-Franzens-University Graz, Universitaetsplatz 5, A-8010 Graz, Austria
P. Pölt
Affiliation:
Institute of Physics, Karl-Franzens-University Graz, Universitaetsplatz 5, A-8010 Graz, Austria
A. Reichmann
Affiliation:
Institute for Electron Microscopy, Graz University of Technology, Steyrergasse 17, A-8010 Graz, Austria
S. Surnev
Affiliation:
Institute of Physics, Karl-Franzens-University Graz, Universitaetsplatz 5, A-8010 Graz, Austria
H. Krenn
Affiliation:
Institute of Physics, Karl-Franzens-University Graz, Universitaetsplatz 5, A-8010 Graz, Austria
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Abstract

Ni-nanowires are fabricated in a two-step electrochemical process. In the first step a porous silicon template with oriented pores perpendicular to the surface is produced. The electrochemical parameters for this etching procedure, like HF-concentration, current-density, etching-time and bath-temperature have to be chosen in a very small regime to obtain the favored structure in a good quality. This mesoporous silicon skeleton with highly oriented pores and homogeneous spatial distribution is filled in a further electrochemical step by a ferromagnetic metal, like Ni. This selforganized Ni-nanowire array is characterized by Auger-spectroscopy to evidence the loading of the pores over the full length. SEM and BSE are used to reveal the orientation of the pores and the homogeneous Ni-filling. By Fourier Transform image processing a predominant quadratic self-organized grouping of the (100) grown pores is identified. An additional investigation method is EDXS to show the element distribution in the sample. Furthermore magnetization measurements are used to generate a model for the Ni-loading in the channels. Not only wires but also granules in the size up to 200 nm are present. IR-spectroscopy investigations are used to compare the bare silicon wafer, the porous silicon (PS) sample and the PS with incorporated Ni at zero and finite magnetic fields.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 872: Symposium J – Micro- and Nanosystems—Materials and Devices , 2005 , J13.13
Copyright
Copyright © Materials Research Society 2005

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References

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