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Focused ion beam microscope as an analytical tool for nanoscale characterization of gradient-formulated polymeric sensor materials

Published online by Cambridge University Press:  26 February 2011

Katharine Dovidenko ,
Radislav A. Potyrailo  and
Games Grande
Katharine Dovidenko
Affiliation:
dovidenk@research.ge.com, GE Global Research Center, 1 Research Circle, Niskayuna, NY, 112309, United States
Radislav A. Potyrailo
Affiliation:
potyrailo@crd.ge.com, GE Global Research Center, United States
Games Grande
Affiliation:
grande@crd.ge.com, GE Global Research Center, United States
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Abstract

In this study, we are demonstrating localized nano-scale analysis of sensor materials which are developed using combinatorial gradient approach. Our technique based on Focused Ion Beam cross-sectioning at specific locations affords establishing metal nano-particles concentrations at best-performing area(s) of gradient-formulated polymer samples. We have achieved three-dimensional characterization/mapping of nano-fillers (30-100 nm metal particles) in composite thin films on variety of substrates.

Keywords

sensorion-beam processingnanoscale
Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 894: Symposium LL – Combinatorial Methods and Informatics in Materials Science , 2005 , 0894-LL07-06
Copyright
Copyright © Materials Research Society 2006

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References

REFERENCES

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