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Full-Optical Characterization of Thin Films in Photovoltaic Cells

Published online by Cambridge University Press:  10 February 2011

D. A. Romanov ,
N. Victoria  and
A. V. Kalameitsev
D. A. Romanov
Affiliation:
Institute of Semiconductor Physics, Siberian Branch of the Russian Academy of Sciences, 630090 Novosibirsk, Russia, daroman@isp.nsc.ru
N. Victoria
Affiliation:
Instituto de Fisica, Facultad de Ingenieria, Universidad de la Republica, C.C.30 Montevideo, Uruguay
A. V. Kalameitsev
Affiliation:
Institute of Semiconductor Physics, Siberian Branch of the Russian Academy of Sciences, 630090 Novosibirsk, Russia, daroman@isp.nsc.ru
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Abstract

We present a handy new method of optical investigation of thin semiconductor layers regardless of the substrate's composition and structure. The method was especially developed for the particular case of thin (˜ 1μm ) CdTe films obtained by means of electrochemical deposition on conducting glass for further solar cell applications. The procedure consists in transmission and reflection (or the transmission only) measurements under different thicknesses of the semiconductor layer and following semi-analytical treatment of the data. Finally we obtain the frequency dependencies of the real and imaginary parts of the refractive index for the semiconductor material of the layer.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 426: Symposium J – Thin Films for Photovoltaic and Related Device , 1996 , 587
Copyright
Copyright © Materials Research Society 1996

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