Hostname: page-component-6bb9c88b65-vpjdr Total loading time: 0 Render date: 2025-07-18T01:25:56.134Z Has data issue: false hasContentIssue false
  • English
  • Français

Fundamentals of Picosecond and Femtosecond Laser Solid Interactions

Published online by Cambridge University Press:  28 February 2011

H. Kurz
H. Kurz*
Affiliation:
Institute of Semiconductor Electronics, Aachen University of Technology, D-5100 Aachen, F.R. Germany
Get access

Abstract

The current understanding of the interaction between ultrashort laser pulses and condensed matter is demonstrated on a few selected samples. Hot electronic carrier relaxation in GaAs, plasmon aided recombination in highly excited silicon and ultrafast energy transport in metals are discussed.

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

Article purchase

Temporarily unavailable

References

1. Laser Solid Interactions and Laser Processing, edited by Ferris, S.D., Lemay, H.J. and Poate, J.M. (American Institute of Physics, New York 1979)Google Scholar
2. Laser and Electron Beam Processing of Materials, edited by White, C.W. and Peercy, P.S. (Academic Press, New York, 1980)Google Scholar
3. Laser and Electron Beam Solid Interactions and Materials Processing, edited by Gibbons, J.F., Hess, L.D. and Siegrman, T.W. (Elsevier North-Holland, New York, 1981) Mat. Res. Soc. Symp. Proc. 1(1981)Google Scholar
4. Laser and Electron Beam Solid Interactions with Solids, edited by Appleton, B.R. and Celler, G.K. (Elsevier North-Holland, New York, 1982), Mat. Res. Soc. Symp. Proc. 4, 49 (1982)Google Scholar
5. Laser-Solid Interactions and Transient Thermal Processing of Materials, edited by Narayan, J., Brown, W.L. and Lemons, R.A. (Elsevier North-Holland, New York,1983) Mat Res. Soc. Symp. Proc. 13, 1983Google Scholar
6. Laser Annealing of Semiconductors, edited by Poate, J. M. and Mayer, J. (Academic Press, New York, 1982)Google Scholar
7. Energy Beam-Solid Interactions and Transient Thermal Processing, edited by Fan, J.C.C. and Johnson, N.M. (Elsevier North-Holland, New York, 1985) Mat. Res. Soc. Symp. Proc. 23, 1984Google Scholar
8. Energy Beam - Solid Interactions and Transient Thermal Processing, edited by. Biegelsen, D.K., Rozgony, G. A. and Shank, C.V. (Elsevier North Holland, New York, 1985) Mat Res. Soc. Symp. Proc. 35, 1985Google Scholar
9. Beam Solid Interactions and Phasetransitions, edited by Kurz, H., Ohlson, G.L. and Poate, J.M., Mat. Res. Soc. Symp. Proc. 51, 1986 Google Scholar
10. Ultrafast Phenomena, edited by Fleming, G.R. and Siegman, A.E., Springer Series in Chemical Physics 46, 1986 Google Scholar
11. Taylor, A.J., Erskine, D.J. and Tang, C.L., JOSA B, 2, 663 (1985)Google Scholar
12. Shank, C.V., Fork, R.L., Yen, R., Shah, J., Greene, B.I., Gossard, A.C. and Weisbuch, C., Solid State Communications 47, 981 (1983)CrossRefGoogle Scholar
13. Xu, Z.Y. and Tang, C.L., Appl. Phys. Letters, 44, 981 (1983)Google Scholar
14. Oudar, J.L., Hulin, D., Migus, A., Antonetti, A. and Alexandre, F., Phys. Rev. Letters, 55, 2074, (1985)CrossRefGoogle Scholar
15. Knox, W. H., Hirliman, C., Miller, D.A.B., Shah, J., Chemla, D.S. and Shank, C.V., to be publishedGoogle Scholar
16. Liu, J.M., Malvezzi, A.M. and Bloembergen, N., reference 8, p. 137Google Scholar
17. Kurz, H. and Bloembergen, N., reference 8, p. 1Google Scholar
18. Lompre, L.A., Liu, J.M., Kurz, H. and Bloembergen, N., Appl. Phys. Letters 44, 3 (1984)Google Scholar
19. Downer, M. and Shank, C.V., Phys. Rev. Lett., 56, 761 (1986)CrossRefGoogle Scholar
20. Rasolt, M. and Kurz, H., Phys. Rev. Letters, 54, 722 (1985)CrossRefGoogle Scholar
21. Malvezzi, A.M., Huang, C.Y., Kurz, H. and Bloembergen, N., in reference 9, p.201Google Scholar
22. Rasolt, M., Phys. Rev. B 33, 1166 (1986)Google Scholar
23. Eelsley, G.L., Phys. Rev. Lett 51, 2140 (1983) and Phys. Rev.B 33, 2140 (1986)Google Scholar
24. Elsayd-Ali, H., Pessot, M., Norris, N. and Mourdon, G., in reference 10, p.264Google Scholar
25. Fujimoto, J.G., Liu, J.M. and Bloembergen, N., Phys. Rev. B 53, 1837 (1984)Google Scholar
26. Schoenlein, R.W., Liu, W.Z., Fujimoto, J.G. and Eelsley, G.L., in reference 10, p. 260Google Scholar
27. Brorson, S.D., Fujimoto, J.G. and Ippen, E., to be publishedGoogle Scholar
28. Williamsen, S., Mourou, G. and Li, J.C.M., reference 8, p. 87Google Scholar