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Published online by Cambridge University Press: 25 February 2011
Reactions of C2H4, C3H8, and CH4 on Si(111) and C2H4 on Si(100) have been investigated for surface temperatures in the range of 1062 K to 1495 K. These studies used x-ray photoelectron spectroscopy to identify the reaction products, characterize the solid state transport process, determine the nucleation mechanism and growth kinetics, and assess orienta-tion effects. The results are used to provide insight into the mechanisms of SiC CVD processes.