Hostname: page-component-78c5997874-xbtfd Total loading time: 0 Render date: 2024-11-13T02:24:44.667Z Has data issue: false hasContentIssue false

Growth Kinetics of an Amorphous Phase Between GaAs and Co

Published online by Cambridge University Press:  26 July 2012

F. Y. Shiau
Affiliation:
Currently with Tze-Chiang Foundation of Science and Technology, Semiconductor Research Center, Hsin-Chu, Taiwan, R.O.C.
Y. A. Chang
Affiliation:
Department of Materials Science and Engineering, University of Wisconsin-Madison, Madison, WI53706, U.S.A.
Get access

Abstract

Solid-state amorphization reaction between GaAs and Co thin-films was investigated by transmission electron micorscopy and Auger electron spectroscopy. Upon annealing of GaAs/Co thin-film couples at 260–300 °C, an amorphous phase was observed to form. The amorphization was attributed to the openness of the GaAs structure relative to the size of the Co atoms. This allows rapid diffusion of Co into the GaAs lattice and promotes the occurrence of SSAR. Annealing at higher temperatures or for longer times led to the formation of a crystalline phase, designated as the μ-phase which was determined to be a metastable supersaturated solid solution of CoAs exhibiting the B31 structure of the approximate composition of Co(Ga. .48As.52). The growth kinetics of both the amorphous phase and the μ-phase are parabolic in nature. The parabolic rate constant is higher for the μ-phase than for the amorphous phase. The activation energies are 1.47 and 1.35 eV, respectively.

Type
Research Article
Copyright
Copyright © Materials Research Society 1992

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1 Schwarz, R.B. and Johnson, W.L., Phys. Rev. Lett., 51, 415(1983).Google Scholar
2. Schwarz, R.B., Wong, K.L., Johnson, W.L. and Clemens, B.M., J. Non-Cryst.Solid, 61–62, 129 (1984).Google Scholar
3. Clemens, B.M., Johnson, W.L., and Schwarz, R.B., J. Non-Cryst. Solid, 61–62, 817 (1984).Google Scholar
4 Newcomb, S.B. and Tu, K.N., Appl. Phys. Lett. 48 1437 (1986).Google Scholar
5 Barbour, J.C., Saris, F.W., Wastasi, M., and Mayer, J.W., Phys. Rev., B32, 1363 (1985).Google Scholar
6. Schroder, H., Samwer, K., and Koster, U., Phys. Rev. Lett., 54, 197 (1985).Google Scholar
7. Rossum, M. Van, Nicolet, M.A., and Johnson, W.L., Phys. Rev., B29, 5498(1984).Google Scholar
8. Guilmin, P., Guyot, P., and Marchal, G., Phys. Lett., 109A, 174 (1985).Google Scholar
9. Herd, S.R., Tu, K.N., and Ahn, K.Y., Appl. Phys. Lett., 42, 597 (1983).Google Scholar
10. Matan, M., Appl. Phys. Lett., 49, 257 (1986).Google Scholar
11. Holloway, K. and Sinclair, R., J. Appl. Phys., 61, 1359 (1987).Google Scholar
12. Lur, W. and Chen, L.J., Appl. Phys. Lett., 54, 1217 (1989).Google Scholar
13. Cheng, J.Y. and Chen, L.J., Appl. Phys. Lett. 57, 612 (1990).Google Scholar
14. Uskov, V.A., Fedotov, A.B., Eroteeva, E.A., Rodionov, A.I., and Dzhumakulov, D.T., Izv. Akad. Nauk SSSR, Neorgan. Mater., 23, 186 (1987).Google Scholar
15. Sands, T., Chang, C.C., Kaplan, A.S., Keramidas, v.G., Kirshnan, K.M., and Washburn, J., Appl. Phys. Lett., 50 1436 (1987).Google Scholar
16. Caron-Popowich, R., Washburm, J., Sands, T., and Kaplan, A.S., J. Appl.Phys., 64, 4909 (1988).Google Scholar
17. Shiau, F.Y. and Chang, Y.A., Appl. Phys. Lett., 55, 1510 (1989).Google Scholar
18. Shiau, F.Y., PhD Thesis, University of Wisconsin, Madison, WI (1990).Google Scholar
19. Shiau, F.Y. and Chang, Y.A., in Thin-Film Structures and Phase Stability(Eds.: B.M. Clemens and W.J. Johnson), Mat. Res. Soc. Symp. Proc., (1990).Google Scholar
20. Shiau, F.Y. and Chang, Y.A., Mat. Res. Soc. Symp., 148, 29 (1989).Google Scholar
21. Shiau, F.Y., Chang, Y.A. and Chen, L.J., J. Electron. Mater., 17, 433 (1988).Google Scholar
22. Shiau, F.Y., Zuo, Y., Lin, J.C., Zheng, X.Y., and Chang, Y.A., Z. Metallk., 80, 544(1989).Google Scholar
23. Kulikov, G.S. and Nikulitsa, I.N., Sov. Phys. -Solid State 14, 2335 (1973).Google Scholar
24. Wyckoff, R.W.G., in Crystal structure, 2nd ed. (Wiley, New York, 1963), Vol. 1, p 122.Google Scholar
25. Jan, C.H., Swenson, D. and Chang, Y.A., in Fundamentals and Applications of Ternary Diffusion (Ed..: Purdy, G.R.), Pergamon Press, New York, 127(1990).Google Scholar
26. Zhang, M.X., Chang, Y.A. and Marcotte, V.C., J. Electrochem. Soc. 137, 3158(1990).Google Scholar