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High Performance of Y-doped Sn-Zn-O Films Fabricated by Solution-process for Amorphous Thin Film Transistors

Published online by Cambridge University Press:  07 January 2014

Yunxuan Yu
Affiliation:
Institute of Microelectronics, Peking University, Beijing 100871, China
Xian Gong
Affiliation:
Institute of Microelectronics, Peking University, Beijing 100871, China
Dong Liu
Affiliation:
Institute of Microelectronics, Peking University, Beijing 100871, China Peking University Shenzhen Graduate School, Shenzhen, 518055, China
Yan Wang*
Affiliation:
Institute of Microelectronics, Peking University, Beijing 100871, China
Jinfeng Kang*
Affiliation:
Institute of Microelectronics, Peking University, Beijing 100871, China
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Abstract

The effect of Y dopant incorporated into ZTO with different Y ratios in Y-ZTO system on the performances of ZTO-based TFTs is investigated by using sol-gel process. The proper Y doped ZTO present both high film crystallization temperature and superior electrical properties as an active channel layer of TFTs. The fabricated YZTO-based TFTs with 11% Y show the excellent devices performance such as the channel field effect mobility of 1.756 cm2/Vs, SS of 2.13 V/dec, threshold voltage of 0.8V and on/off ratio of 3.12×106.

Type
Articles
Copyright
Copyright © Materials Research Society 2014 

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References

REFERENCES

Hyung Lim, Jun, Hyun Shim, Jong, APPLIED PHYSICS LETTERS 95, 012108 2009 Google Scholar
Fortunato*, E., Barquinha, P., Martins, R., Advanced Materials, Volume 24, Issue 22, pages 29452986, June 12, 2012 10.1002/adma.201103228CrossRefGoogle Scholar
Seo, Seok-Jun,JOURNAL OF PHYSICS D: APPLIED PHYSICS42 (2009) 035106 (5pp)10.1088/0022-3727/42/3/035106CrossRefGoogle Scholar
Hong Jun, LeeJournal of the Korean Physical Society April 2013, Volume 62, Issue 8, pp 11761182 Google Scholar
Ting∗, Chu-Chi;, Chang, Shiep-Ping, Li, Wei-Yang, Wang, Ching-Hua, Applied Surface Science, 284(2013) 397404, July 29, 2013 10.1016/j.apsusc.2013.07.111CrossRefGoogle Scholar
Young Koo, Chang, Song, Keunkyu, Jung, Yangho, Yang, Wooseok, Kim, Seung-Hyun, Jeong, Sunho, and Moon, Jooho, ACS Appl. Mater. Interfaces, 2012, 4(3), pp 14561461 Google Scholar
Joon Kim, Si, et al. ., Journal of Crystal Growth 326 (2011) 163165.Google Scholar
Jeong, W. H. et al. ., Thin Solid Films. 519(2011)57405743.10.1016/j.tsf.2010.12.210CrossRefGoogle Scholar
Yong Chong, Ho, et al. ., Appl. Phys. Lett. 99, 161908 (2011).10.1063/1.3655197CrossRefGoogle Scholar
Hyun Yoon, Doo, et al. ., Journal of Crystal Growth 326 (2011) 171174.10.1016/j.jcrysgro.2011.01.090CrossRefGoogle Scholar
Shin, Hyun Soo, Kim, Gun Hee, Jeong, Woong Hee, Ahnl, Byung Du, and Kim, Hyun Jae, Japanese Journal of Applied Physics 49 (2010) 03CB01 Google Scholar