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High Performance Photoluminescence Spectroscopy using Fourier Transform Interferometry

Published online by Cambridge University Press:  25 February 2011

M.L.W. Thewalt ,
M.K. Nissen ,
D.J.S. Beckett  and
K.R. Lundgren
M.L.W. Thewalt
Affiliation:
Department of Physics, Simon Fraser University, Burnaby, BC, Canada V5A 1S6
M.K. Nissen
Affiliation:
Department of Physics, Simon Fraser University, Burnaby, BC, Canada V5A 1S6
D.J.S. Beckett
Affiliation:
Department of Physics, Simon Fraser University, Burnaby, BC, Canada V5A 1S6
K.R. Lundgren
Affiliation:
Department of Physics, Simon Fraser University, Burnaby, BC, Canada V5A 1S6
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Abstract

We present recent results on the applications of Fourier transform techniques to photoluminescence spectroscopy as it relates to both basic and characterization-related semiconductor research. The emphasis here is on demonstrating the advantages of these methods in situations requiring very high spectral resolution and/or very high sensitivity. We also provide an example of the utility of interferometry in performing photoluminescence excitation spectroscopy in spectral regions where broadly tunable laser sources are not readily available.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 163: Symposium G – Impurities, Defects and Diffusion in Semiconductors: Bulk and Layered Structures , 1989 , 221
Copyright
Copyright © Materials Research Society 1990

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