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In situ TEM Straining of Nanograined Al Films Strengthened with Al2O3 Nanoparticles

Published online by Cambridge University Press:  01 February 2011

Khalid Hattar ,
Blythe G. Clark ,
James A Knapp ,
David M Follstaedt  and
I. M. Robertson
Khalid Hattar
Affiliation:
khattar@sandia.gov
Blythe G. Clark
Affiliation:
blyclar@sandia.gov, Sandia National Laboratories, PO Box 5800, MS 1423, Albuquerque, New Mexico, NM, United States, 505-844-7339
James A Knapp
Affiliation:
jaknapp@sandia.gov, Sandia National Laboratories, PO Box 5800, MS 1423, Albuquerque, New Mexico, NM, United States, 505-844-7339
David M Follstaedt
Affiliation:
dmfolls@sandia.gov, Sandia National Laboratories, PO Box 5800, MS 1423, Albuquerque, New Mexico, NM, United States, 505-844-7339
I. M. Robertson
Affiliation:
robertson@fakeemail.com, University of Illinois at Urbana-Champaign, Dept. of Materials Science & Engineering, Urbana, Illinois, United States
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Abstract

Growing interest in nanomaterials has raised many questions regarding the operating mechanisms active during the deformation and failure of nanoscale materials. To address this, a simple, effective in situ TEM straining technique was developed that provides direct detailed observations of the active deformation mechanisms at a length scale relevant to most nanomaterials. The capabilities of this new straining structure are highlighted with initial results in pulsed laser deposited (PLD) Al-Al2O3 thin films of uniform thickness. The Al-Al2O3 system was chosen for investigation, as the grain size can be tailored via deposition and annealing conditions and the active mechanisms in the binary system can be compared to previous studies in PLD Ni and evaporated Al films. PLD Al-Al2O3 free-standing films of various oxide concentrations and different thermal histories were produced and characterized in terms of average grain and particle sizes. Preliminary in situ TEM straining experiments show intergranular failure for films with 5 vol% Al2O3. Further work is in progress to explore and understand the active deformation and failure mechanisms, as well as the dependence of mechanisms on processing routes.

Keywords

nanostructuretransmission electron microscopy (TEM)Al
Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 1262: Symposium V/W – In-Situ and operando Probing of Energy Materials at Multiscale Down to Single Atomic Couumn-The Powerof X-Rays, Neutons and Electrons Microscopy , 2010 , 1262-V01-04
Copyright
Copyright © Materials Research Society 2010

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