Hostname: page-component-745bb68f8f-hvd4g Total loading time: 0 Render date: 2025-01-28T14:22:35.075Z Has data issue: false hasContentIssue false
  • English
  • Français

The Influence of Grain-Boundary Structural Disorder on the Magnetic Properties of Nanocrystalline Nickel

Published online by Cambridge University Press:  21 February 2011

Barbara Szpunar ,
Uwe Erb ,
Karl T. Aust ,
Gino Palumbo  and
Laurent J. Lewis
Barbara Szpunar
Affiliation:
Department of Materials and Metallurgical Engineering, Queen's University, Kingston, Ontario, Canada K7L 3N6
Uwe Erb
Affiliation:
Department of Materials and Metallurgical Engineering, Queen's University, Kingston, Ontario, Canada K7L 3N6
Karl T. Aust
Affiliation:
Department of Metallurgy and Materials Science, University of Toronto, Toronto, Ontario, Canada M5S 1A4
Gino Palumbo
Affiliation:
Ontario Hydro Research Division, 800 Kipling Ave, Toronto, Ontario, Canada M8Z 5S4
Laurent J. Lewis
Affiliation:
Département de physique et Groupe de recherche en physique et technologie des couches minces, Université de Montréal, Case postale 6128, Succursale A, Montréal, Québec, Canada H3C 3J7
Get access

Abstract

The influence of grain boundaries on the magnetic properties of nanocrystalline nickel, in particular the ∑ = 3 and ∑ = 5 special grain boundaries and the extreme case of a purely amorphous sample, has been investigated. Our calculations reveal that the magnetic moment is rather insensitive to the structural disorder varying by at most 15 %. These results correlate extremely well with the recent observation in electrodeposited nickel that the magnetic moment depends very little on grain size, down to about 10 nm.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 318: Symposium Ca – Interface Control of Electrical, Chemical, and Mechanical Properties , 1993 , 477
Copyright
Copyright © Materials Research Society 1994

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1 Gleiter, H., Progr. Mat. Sci. 33, 223 (1981).CrossRefGoogle Scholar
2 Palumbo, G., Thorpe, S.J., and Aust, K.T., Scripta Metall. 24, 1347 (1990).CrossRefGoogle Scholar
3 Wagner, W., Wiedenmann, A., Petry, W., Geibel, A., and Gleiter, H., J. Mat. Res. 6, 2305 (1991).CrossRefGoogle Scholar
4 Gong, W., Li, H., Zhao, Z., and Chen, J., J. Appl. Phys. 69, 5119 (1991).CrossRefGoogle Scholar
5 Gangopadhyay, S., Hadjipanayis, G.C., Dale, B., Sorensen, C.M., and Klabunde, J., Nanost. Mat. 1, 77 (1992).CrossRefGoogle Scholar
6 Du, Y.W., Xu, M.X., Wu, J., Shi, Y.B., Lu, H.X., and Xue, R.H., J. Appl. Phys. 70, 5903 (1991).CrossRefGoogle Scholar
7 Aus, M.J., Szpunar, B., El Sherik, A. M., Erb, U., Palumbo, G., and Aust, K.T., Scripta Metall. et Mater. 27, 1639 (1992).CrossRefGoogle Scholar
8 Herr, U., Jing, J., Birringer, R., Gonser, U., and Gleiter, H., Appl. Phys. Lett. 50, 472 (1987).CrossRefGoogle Scholar
9 Schaefer, H. E., in Mechanical Properties and Deformation Behaviour of Materials Having Ultra-Fine Microstructures, Proceedings of the NATO Advanced Study Institute, Portugal, June 28th to July, 10th, 1992, edited by Nastasi, M. A. (Kluwer, Dordrecht, The Netherlands).Google Scholar
10 Richter, J., Handrich, K., and Schreiber, J., Phys. Stat. Sol (b) 68, K61 (1975).Google Scholar
11 Krauss, U. and Krey, U., J. Mag. Mag. Mat. 98, L1 (1991).CrossRefGoogle Scholar
12 Turek, I. and Hafner, J., Phys. Rev. 46, 247 (1992).CrossRefGoogle Scholar
13 Xu, Y. N., He, Y., and Ching, W. Y., J. Appl. Phys. 69, 5460 (1991).CrossRefGoogle Scholar
14 Szpunar, B., Erb, U., Aust, K.T., Palumbo, G., and Lewis, L.J., submitted.Google Scholar
15 Szpunar, B., Erb, U., Aust, K.T., Palumbo, G., and Lewis, L.J., in preparation.Google Scholar
16 Dagens, L., J.Phys. F16, 1373 (1986).Google Scholar
17 Andersen, O.K., Jepsen, O. and Sob, M., in Electronic Band Structure and its Applications, edited by Yussouff, M. (Springer-Verlag, Berlin, 1986), p. 440.Google Scholar
18 Foiles, S.M., Baskes, M.I., and Daw, M.S., Phys. Rev. B 33, 7983 (1986).CrossRefGoogle Scholar
19 Turek, I., Becker, Ch., and Hafner, J., J. Phys. C4, 7257 (1992).Google Scholar
20 Tamura, K. and Endo, H., Phys. Lett. 29A, 52 (1969).Google Scholar