Hostname: page-component-78c5997874-lj6df Total loading time: 0 Render date: 2024-11-11T13:41:50.962Z Has data issue: false hasContentIssue false

Influence of the substrate temperature on the structure of SrBi2Ta2O9 thin films obtained by laser ablation

Published online by Cambridge University Press:  10 February 2011

J. A. Díaz
Affiliation:
Centro de Investigación Cientifica y de Educación Superior de Ensenada
M. P. Cruz
Affiliation:
Centro de Investigación Cientifica y de Educación Superior de Ensenada
O. E. Contreras
Affiliation:
Centro de Investigación Cientifica y de Educación Superior de Ensenada
J. M. Siqueiros
Affiliation:
SCentro de Ciencias de la Materia Condensada, UNAM
J. Portelles
Affiliation:
Facultad de Fisica-IMRE, Universidad de la Habana
Get access

Abstract

A systematic study is presented of the resulting SBT films deposited by PLD at substrate temperatures from 300 to 600°C. The characteristics of the film as-deposited are determined. Special attention is focused on the compositional and structural properties. XRD, SEM, and TEM analyses are reported.

Type
Research Article
Copyright
Copyright © Materials Research Society 1999

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1. Scott, J. F. and Araujo, C. A., Science 246, 1400 (1989)Google Scholar
2. Evans, J. T. and Womak, R., IEEE J. Solid-State Circuits SSC–23, 1171 (1988)Google Scholar
3. Duiker, H. M., Beale, P. D., Scott, J. F., Araujo, C. A., Melnick, B. M., Cuchiaro, J. D., and McMillan, L. D., J. Appl. Phys. 68, 5783 (1990)Google Scholar
4. Araujo, C. A., Cuchiaro, J. D., McMillan, L. D., Scott, M. C., and Scott, J. F., Nature 374, 627 (1995)Google Scholar
5. Desu, S. B. and Vijay, D. P., Mater. Sci. Eng. B32, 75 (1995)Google Scholar
6. Dat, R., Lee, J. K., Auciello, O., and Kingon, A. J., Appl. Phys. Lett. 67, 572 (1995)Google Scholar
7. Jones, R. E., Maniar, P. D., Moazzami, R., Zurcher, P., Witowski, J. Z., Lii, Y. T., Chu, P., Gillespie, S. J., Thin Solid Films 270, 584 (1995)Google Scholar
8. Atsuki, T., Soyama, N., Yonezawa, T., and Ogi, K., Jpn. J. Appl. Phys. 34, 5096 (1995)Google Scholar
9. Amanuma, K., Hase, T., and Miyasaka, Y., Appl. Phys. Lett. 66, 221 (1995)Google Scholar
10. Li, T., Zhu, Y., Desu, S. B., Peng, C. H., and Nagata, M., Appl. Phys. Lett. 68, 616 (1996)Google Scholar
11. Seong, N. J., Yoon, S. G., and Lee, S. S., Appl. Phys. Lett. 71, 81 (1997)Google Scholar
12. Song, T. K., Lee, J. K., and Jung, H. J., Appl. Phys. Lett. 69, 3839 (1996)Google Scholar
13. Lee, J. S., Kim, H. H., Kwon, H. J., and Jeong, Y. W, Appl. Phys. Lett. 73, 166 (1998)Google Scholar