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Interface Characterisation Using an SEM-Based Micro-Indentor

Published online by Cambridge University Press:  15 February 2011

M.H. Lewis ,
A.M. Daniel  and
M.G. Cain
M.H. Lewis
Affiliation:
Centre for Advanced Materials, University of Warwick, Coventry, CV4 7AL, UK
A.M. Daniel
Affiliation:
C.E.I.T., 20080, San-Sebastian, Spain
M.G. Cain
Affiliation:
Centre for Advanced Materials, University of Warwick, Coventry, CV4 7AL, UK
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Abstract

The design and performance of an SEM-based microindentor, for interfacial property measurements in CMCs, is described. It enables high resolution imaging and simultaneous load/displacement monitoring with capacity and resolution of 20N ± lmN (load) and 100μm ± 10nm (displacement). Its application to measurement of interface debond and shear stresses for a wide range of fibres and monofilaments is described.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 365: Symposium M – Ceramic Matrix Composites–Advanced High-Temperature Structural Materials , 1994 , 269
Copyright
Copyright © Materials Research Society 1995

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References

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