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Published online by Cambridge University Press: 28 June 2011
In this study, novel Si2Sb2Te6 phase change material is investigated in detail for the phase change memory application using transmission electron microscopy and X-ray photoelectron spectroscopy. The phenomenon that Te diffuses to the film surface during phase switching and successively evaporates out has been confirmed. The phase change memory cells employing Si2Sb2Te6 and Si3Sb2Te3 materials are fabricated and programmed. For the Si2Sb2Te6-based cell a data endurance of 5×105 cycles is achieved with a failure mode resembling reset stuck, which can be attributed to the migration of Tellurium during the operation cycles. It means that a thermally stable material system of SixSb2Te3 is preferred for the PCM applications.