Hostname: page-component-745bb68f8f-lrblm Total loading time: 0 Render date: 2025-01-28T13:59:36.074Z Has data issue: false hasContentIssue false
  • English
  • Français

Laser Induced Periodic Surface Structure

Published online by Cambridge University Press:  15 February 2011

H.M. Van Driel ,
Jeff F. Young  and
J.E. Sipe
H.M. Van Driel
Affiliation:
Department of Physics and Erindale College, University of Toronto, Toronto, Ontario, Canada M5S IA7
Jeff F. Young
Affiliation:
Department of Physics and Erindale College, University of Toronto, Toronto, Ontario, Canada M5S IA7
J.E. Sipe
Affiliation:
Department of Physics and Erindale College, University of Toronto, Toronto, Ontario, Canada M5S IA7
Get access

Abstract

Laser induced periodic surface structure can be understood as a universal phenomenon which occurs when high intensity pulses are absorbed near the surface of solids or liquids. The phenomenon occurs on metals, semiconductors and insulators because of the interference between the incident pulse and an induced “radiation remnant”. This scattered field may be enhanced by the existence of true surface modes such as surface plasmons or phonon-polaritons but this is not essential. The universality characteristics include beam polarization, since we show that circularly polarized light can induce surface ripples, with the damage structure showing a dependence on the sense of rotation. We also present time resolved results of the formation of the ripples to illustrate the essential dynamical processes that occur.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 13 , 1982 , 197
Copyright
Copyright © Materials Research Society 1983

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1.Birnbaum, M., J. Appl. Phys. 36, 3688 (1965).Google Scholar
2.Leamy, H.J., Rozgonyi, G.A., Sheng, T.T. and Celler, G.K., Appl. Phys. Lett. 32, 535 (1978).Google Scholar
3.Isenor, N.R., Appl. Phys. Lett. 31, 148 (1977).Google Scholar
4.Young, J.F., Sipe, J.E., Gallant, M.I., Preston, J.S. and van Driel, H.M., in “Laser and Electron Beam Interactions with Solids” Appleton, B.R. and Celler, G.K., eds. (North Holland, 1982).Google Scholar
5.Young, J.F., Sipe, J.E., Preston, J.S. and van Driel, H.M., Appl. Phys. Lett. 41, 261 (1982).Google Scholar
6.van Vechten, J.A., Solid State Commun. 39, 1285 (1981).Google Scholar
7.Walters, C.T., Appl Phys. Lett. 25, 696 (1974);Google Scholar
7aEmmony, D.C., Howson, R.P. and Willis, L.J., Appl. Phys. Lett. 23, 598 (1973).Google Scholar
8.Temple, P.A. and Soileau, M.J., IEEE J. Quant. Elec. 17, 2067 (1981).Google Scholar
9.Sipe, J.E., Young, J.F., Preston, J.S. and van Driel, H.M., (Phys. Rev. B, in press).Google Scholar
10.Keilmann, F. and Bai, Y.H., Conference on Lasers and Electro-optics, Phoenix, Az. 1982 (paper WK5); F. Keilmann XIII Int. Conf. on Quantum Electronics, Munich, West Germany (1982).Google Scholar
11.Young, J.F., Preston, J.S., van Driel, H.M. and Sipe, J.E. (Phys. Rev. B, in press).Google Scholar
12.Oron, M. and Sorenson, G., App. Phys. Lett. 35, 782 (1979).Google Scholar
13.Becker, N.E., Walser, R .M., Jhee, Y.K. and Sheng, P.Y., SPIE Conference on “Picosecond Lasers and Applications” Goldberg, L. Ed. P; R.M. Walser, M.F. Becker, D.H. Sheng, and J.G. Ambrose, in “Laser and Electron Bean Interactions and Material Processing,” Gibbons, T.J., Hess, W. and Sigmon, T., eds. (Elsevier, New York, 1981), 177.Google Scholar
14.Ehrlich, D.J., Brueck, S.R.J. and Tsao, J.Y., XII Int. Conference on Quantum Electronics, Munich, West Germany, 1982.Google Scholar
15.Keilmann, F. and Bai, Y.H., Appl. Phys. A, 29, 9 (1982).Google Scholar
16.Brueck, S.R.J. and Ehrlich, D.J., Phys. Rev. Lett. 48, 1678 (1982).Google Scholar
17.Tamir, T. and Oliner, A., J. Opt. Soc. Am. 59, 942 (1969)Google Scholar
17aOsterberger, H. and Smith, L.W.. J.O.S.A. 54, 1973 (1964).Google Scholar
18.Brekhouskikh, L.M., “Waves in Layered Media” (Academic Press Inc., New York, 1960) ChIV, p 234.Google Scholar
19.van Driel, H.M., Sipe, J.E. and Young, Jeff F., Phys. Rev. Lett. (in press).Google Scholar
20.Soileau, N.J. and Van Stryland, E.W., Optical Society of America 1982 Annual Meeting, paper WE7.Google Scholar
21.Young, Jeff F., Sipe, J.E. and van Driel, N.M., Phys. Rev. B, (in press).Google Scholar
22.Sipe, J.E., van Driel, H.M. and Young, Jeff F. (unpublished).Google Scholar
23.Brueck, S.R.J. and Ehrlich, D.J., App. Phys. Lett. 41, 630 (1982).Google Scholar