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Light Scattering Analysis of Strained-Layer Superlattices

Published online by Cambridge University Press:  25 February 2011

G. P. Schwartz ,
G. J. Gualtieri  and
W. A. Sunder
G. P. Schwartz
Affiliation:
AT&T Bell Laboratories Murray Hill, NJ 07974
G. J. Gualtieri
Affiliation:
AT&T Bell Laboratories Murray Hill, NJ 07974
W. A. Sunder
Affiliation:
AT&T Bell Laboratories Murray Hill, NJ 07974
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Abstract

Raman scattering has been used to examine strained-layer GaSb/AlSb superlattices for a variety of growth imperfections. Analysis of zone-folded acoustic phonon spectra permit a determination of the superlattice period, the individual layer widths, some estimate of the interfacial widths, and evidence for variations in layer thicknesses.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 103 , 1987 , 265
Copyright
Copyright © Materials Research Society 1988

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References

REFERENCES

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