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Low Energy Atom Scattering Spectroscopy for Insulator Surface Analysis: MgO(111) Surfaces

Published online by Cambridge University Press:  25 January 2013

K. Umezawa*
Affiliation:
Dept. of Physics, College of Integrated Arts & Sciences, Osaka Prefecture University, 1-1 Gakuen-Cho, Sakai, Osaka 599-8531, Japan
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Abstract

This study described a low-energy atom scattering system combined with a time-of-flight spectrometer and an ultra high vacuum chamber for insulator surface structural analysis. We show one of examples to study of MgO(111) surface analysis. A visual image of Mg atoms due to the projected blocking pattern represents the crystalline structure of the MgO(111) surfaces. This figure shows the trajectory of scattered 4He0 particles due to Mg atoms along low-index lattice planes and crystallographic directions. Insulator surface structural analysis becomes more important in materials sciences.

Type
Articles
Copyright
Copyright © Materials Research Society 2013

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References

REFERENCES

Feldman, L. C, Mayer, J. W., Fundamentals of Surface and Thin Film Analysis, (North-Holland, 1986).Google Scholar
Umezawa, K., Nakanishi, S., Hayashi, H., Higashitsutsumi, H., Nagasawa, H., Ogai, K., MRS online proceeding library, 2011, vol. 1318, mrsf10-1318-ss05-05.Google Scholar
Smith, D. P., J. Appl. Phys. 38, 340 (1967).CrossRefGoogle Scholar
Katayama, M., Nomura, E., Kanekuma, N., Soejima, H., Aono, M., Nucl. Instr. Meth. B 33, 857 (1988).CrossRefGoogle Scholar
Sumitomo, K., Oura, K., Katayama, I., Shoji, F., Hanawa, T., Nucl. Instrum. Meth. B 33, 871 (1988).CrossRefGoogle Scholar
Yoshimoto, M., Maeda, T.,Shimozono, K., Koinuma, H., Shinohara, M., Ishiyama, O. and Ohtani, F., Appl. Phys. Lett. 65, 3197 (1994).CrossRefGoogle Scholar
Umezawa, K., Nakanishi, S., Kojima, K., Yoshimura, M., Ueda, K., Gibson, W. M., Phys. Rev. B 63, 035402 (2001).CrossRefGoogle Scholar
Rabalis, J. W., Low Energy Ion Surface Interactions, (Wiley, 1994).Google Scholar
Moliére, G., Naturforsch, Z.. Teil A 2 (1947) 133.Google Scholar
Firsov, O. B., Sov. Phys, JETP 6 (1958) 534.Google Scholar