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Measurement of Ultrafast Carrier Dynamics in Epitaxial Graphene

Published online by Cambridge University Press:  01 February 2011

Jahan M. Dawlaty ,
Shriram Shivaraman ,
Mvs Chandrashekhar ,
Michael G. Spencer  and
Farhan Rana
Jahan M. Dawlaty
Affiliation:
jd234@cornell.edu, Cornell University, ECE, 113 Philips Hall, Cornell University, Ithaca, NY, 14853, United States, 607-255-5868
Shriram Shivaraman
Affiliation:
ss626@cornell.edu, Cornell University, Electrical and Computer Engineering, Philips Hall, Cornell University, Ithaca, NY, 14853, United States
Mvs Chandrashekhar
Affiliation:
mc296@cornell.edu, Cornell University, Electrical and Computer Engineering, Philips Hall, Cornell University, Ithaca, NY, 14853, United States
Michael G. Spencer
Affiliation:
spencer@ece.cornell.edu, Cornell University, Electrical and Computer Engineering, Philips Hall, Cornell University, Ithaca, NY, 14853, United States
Farhan Rana
Affiliation:
farhan.rana@cornell.edu, Cornell University, Electrical and Computer Engineering, Philips Hall, Cornell University, Ithaca, NY, 14853, United States
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Abstract

Using ultrafast optical pump-probe spectroscopy, we have measured carrier relaxation times in epitaxial graphene layers grown on SiC wafers. We find two distinct time scales associated with the relaxation of nonequilibrium photogenerated carriers. An initial fast relaxation transient in the 70-120 fs range is followed by a slower relaxation process in the 0.4-1.7 ps range. The slower relaxation time is found to be inversely proportional to the degree of crystalline disorder in the graphene layers as measured by Raman spectroscopy. We relate the measured fast and slow time constants to carrier-carrier and carrier-phonon intraband and interband scattering processes in graphene.

Keywords

optical propertiesoptoelectronicelectron-phonon interactions
Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 1081: Symposium P – Carbon Nanotubes and Related Low-Dimensional Materials , 2008 , 1081-P06-04
Copyright
Copyright © Materials Research Society 2008

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References

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