Crossref Citations
This article has been cited by the following publications. This list is generated based on data provided by
Crossref.
Schmidt, Daniel
Schubert, Eva
and
Schubert, Mathias
2013.
Ellipsometry at the Nanoscale.
p.
341.
Hofmann, Tino
Schmidt, Daniel
and
Schubert, Mathias
2013.
Ellipsometry at the Nanoscale.
p.
411.
Liang, D.
Schmidt, D.
Wang, H.
Schubert, E.
and
Schubert, M.
2013.
Generalized ellipsometry effective medium approximation analysis approach for porous slanted columnar thin films infiltrated with polymer.
Applied Physics Letters,
Vol. 103,
Issue. 11,
p.
111906.
Schmidt, Daniel
2014.
Characterization of highly anisotropic three-dimensionally nanostructured surfaces.
Thin Solid Films,
Vol. 571,
Issue. ,
p.
364.
Rodenhausen, Keith B.
Schmidt, Daniel
Rice, Charles
Hofmann, Tino
Schubert, Eva
and
Schubert, Mathias
2014.
Ellipsometry of Functional Organic Surfaces and Films.
Vol. 52,
Issue. ,
p.
135.
He, Li-Jun
Wang, Li-Yan
Chen, Wei-Zhong
and
Liu, Xing-Zhao
2016.
Electrical performance of alumina films made in EB evaporation.
Modern Physics Letters B,
Vol. 30,
Issue. 20,
p.
1650260.
Hofmann, T.
Knight, S.
Sekora, D.
Schmidt, D.
Herzinger, C.M.
Woollam, J.A.
Schubert, E.
and
Schubert, M.
2017.
Screening effects in metal sculptured thin films studied with terahertz Mueller matrix ellipsometry.
Applied Surface Science,
Vol. 421,
Issue. ,
p.
513.
Rodenhausen, Keith B.
Schmidt, Daniel
Rice, Charles
Hofmann, Tino
Schubert, Eva
and
Schubert, Mathias
2018.
Ellipsometry of Functional Organic Surfaces and Films.
Vol. 52,
Issue. ,
p.
225.
Knight, Sean
Prabhakaran, Dharmalingam
Binek, Christian
and
Schubert, Mathias
2019.
Electromagnon excitation in cupric oxide measured by Fabry-Pérot enhanced terahertz Mueller matrix ellipsometry.
Scientific Reports,
Vol. 9,
Issue. 1,
Ruder, Alexander
Wright, Brandon
Feder, Rene
Kilic, Ufuk
Hilfiker, Matthew
Schubert, Eva
Herzinger, Craig M.
and
Schubert, Mathias
2021.
Mueller matrix imaging microscope using dual continuously rotating anisotropic mirrors.
Optics Express,
Vol. 29,
Issue. 18,
p.
28704.