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Metalized Polypropylene Film in Capacitors: Characterization and The Effect of Interfacial Pressure on the Dielectric Strength

Published online by Cambridge University Press:  15 February 2011

Shalabh Tandon  and
Richard J. Farris
Shalabh Tandon
Affiliation:
Silvio O Conte Building, Polymer Science and Engineering Department, University of Massachusetts, Amherst, MA 01003.
Richard J. Farris
Affiliation:
Silvio O Conte Building, Polymer Science and Engineering Department, University of Massachusetts, Amherst, MA 01003.
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Abstract

Metalized polypropylene film used in high energy density capacitors has been mechanically characterized to determine its elastic constants. The out of plane coefficient of thermal expansion (CTE) of the orthotropic film is 10 times as large as the smaller in plane CTE. The out of plane modulus is twice as large compared to one of the in plane moduli. The effect of interfacial pressure on the dielectric breakdown is also studied for the same film. It is observed that the dielectric strength of the film decreases at first and then increases above 4 MPa of compressive stress.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 476: Symposium N – Low-Dielectric Constant Materials III , 1997 , 147
Copyright
Copyright © Materials Research Society 1997

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